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Current relaxation analysis in AlGaN/GaN high electron mobility transistors
Polyakov, Alexander Y.,Smirnov, N. B.,Shchemerov, Ivan V.,Lee, In-Hwan,Jang, Taehoon,Dorofeev, Alexey A.,Gladysheva, Nadezhda B.,Kondratyev, Eugene S.,Turusova, Yulia A.,Zinovyev, Roman A.,Turutin, A. American Institute of Physics 2017 Journal of Vacuum Science & Technology. B Vol.35 No.1
Degradation-induced low frequency noise and deep traps in GaN/InGaN near-UV LEDs
Lee, In-Hwan,Polyakov, A. Y.,Hwang, Sung-Min,Shmidt, N. M.,Shabunina, E. I.,Tal'nishnih, N. A.,Smirnov, N. B.,Shchemerov, I. V.,Zinovyev, R. A.,Tarelkin, S. A.,Pearton, S. J. American Institute of Physics 2017 Applied Physics Letters Vol.111 No.6