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Cross-Correlation Measurements of Phase Noise Induced by Relative Intensity Noise in Photodetectors
Zhewei Cao,Chun Yang,Zhenghua Zhou 한국광학회 2016 Current Optics and Photonics Vol.20 No.6
Up-converted phase noise, which is induced by the low-frequency relative intensity noise (RIN) of alaser through AM-PM conversion within a photodetector (PD), is first measured here by means of across-correlation method. Our proposed measurement system can isolate the RIN-induced phase noise fromnoise contributions of other components, such as amplifiers, modulators, and mixers. In particular, shotnoise and thermal noise generated from the PD are also suppressed by this method, so that standalonecharacteristics of the RIN-induced phase noise can be obtained. Experimental results clearly show thequantitative relationship between the RIN-induced phase noise and the incident optical power of the PD. Our findings indicate that the least RIN-induced phase noise appeared at the saturation point of the PD,which is about -162 dBc/Hz at 10 kHz offset.
Zhu Dezhao,Cao Zhewei,Li Xianghua,Yang Chun 한국광학회 2014 Current Optics and Photonics Vol.18 No.5
We propose a novel approach to measure the residual phase noise (RPN) of a photodiode (PD) based on a two-tone correlation method. Compared with the previous measurements of the RPNs of PDs, this method is more convenient in practical application. In this method, two microwave sources and other components were placed in two isolated links sharing the same PD, so the noises of them were uncorrelated. With an FFT analyzer, the uncorrelated noises could be mostly suppressed while only the RPN of the PD was preserved. Voltage-dependent nonlinearities of PDs were studied previously. In this letter, we investigate the relationship between the RPN of the PD and the bias voltage on the PD. By changing the bias voltage, the difference of the RPN can be up to 10 dB.