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Superanalysis of Optimum Combining with Application to Femtocell Networks
Youngmin Jeong,Hyundong Shin,Win, M. Z. IEEE 2012 IEEE journal on selected areas in communications Vol.30 No.3
<P>A femtocell technology-towards the deployment of small-cell networks-is a key enabler for improving indoor coverage and throughput per network area at a low cost in future wireless networks. However, these small-cell networking inevitably increases cochannel interference due to aggressive (even uncontrolled) reuse of spectral resources. One of the attractive approaches to alleviating the cochannel interference is a multiple-antenna technique for which accurately characterizing the effects of interference is crucial but challenging. To elucidate this important problem, we analyze the performance of interference rejection diversity combining, often called the optimum combining, in an uplink two-tier femtocell network. Specifically, we consider that a single-antenna femtocell user (transmitter) communicates with a closed femtocell access point (receiver) with multiple antennas in the presence of single-antenna cochannel interferers from co-tier (femtocells) and cross-tier (macrocell) networks. We introduce a new mathematical methodology to analyze the average symbol error probability of optimum combining diversity systems in Rayleigh fading, accounting for multiple unequal-power interferers, each is spatially correlated across receiving antennas. The analysis resorts to the so-called Berezin's supermathematics that treats both commuting and Grassmann anticommuting variables on an equal footing. This powerful supermathematical framework enables us to quantify the cross- and co-tier interference effects in terms of interference power heterogeneity and spatial correlation.</P>
Effect of joint spatial correlation on the diversity performance of space-time block codes
Youngmin Jeong,Hyundong Shin IEEE 2009 IEEE communications letters Vol.13 No.7
<P>We characterize the effect of <I>joint</I> spatial correlation on the diversity performance of multiple-input multiple-output (MIMO) systems. The joint spatial correlation is structured by the coupling matrix whose elements determine the average power coupling between the transmit and receive eigenmodes. We first derive the closed-form expression for the exact symbol error probability (SEP) of orthogonal space-time block codes over jointly correlated MIMO Rayleigh-fading channels. We then show that the achievable diversity order is equal to the number of nonzero elements of the power coupling matrix and establish the <I>Schur</I> monotonicity theorems on the SEP and the effective fading figure as a functional of elements of the power coupling matrix.</P>
Intervehicle Communication: Cox-Fox Modeling
Youngmin Jeong,Jo Woon Chong,Hyundong Shin,Win, M. Z. IEEE 2013 IEEE journal on selected areas in communications Vol.31 No.9
<P>Safety message dissemination in a vehicular ad-hoc network (VANET) requires vehicle-to-vehicle (V2V) communication with low latency and high reliability. The dynamics of vehicle passing and queueing as well as high mobility create distinctive propagation characteristics of wireless medium and inevitable uncertainty in space-time patterns of the vehicle density on a road. It is therefore of great importance to account for random vehicle locations in V2V communication. In this paper, we characterize intervehicle communication in a random field of vehicles, where a beacon or head vehicle (transmitter) broadcasts safety or warning messages to neighboring client vehicles (receivers) randomly located in a cluster on the road. To account for a doubly stochastic property of the VANET, we first model vehicle's random locations as a stationary Cox process with Fox's H-distributed random intensity (vehicle concentration) and derive the distributional functions of the lth nearest client's distance from the beacon in such a Fox Cox field of vehicles. We then consolidate this spatial randomness of receiving vehicles into a path loss model and develop a triply-composite Fox channel model that combines key wireless propagation effects such as the distance-dependent path loss, large-scale fading (shadowing), and small-scale fading (multipath fading). In Fox channel modeling, each constituent propagation effect is described as Fox's H-variate, culminating again in Fox's H-variate for the received power or equivalently the instantaneous signal-to-noise ratio at the lth nearest client vehicle. Due to versatility of Fox's H-functions, this stochastic channel model can encompass a variety of well-established or generalized statistical propagation models used in wireless communication; be well-fitted to measurement data in diverse propagation environments by varying parameters; and facilitate a unifying analysis for fundamental physical-layer performances, such as error probability and channel capacity, using again the language of Fox's H-functions. This work serves to develop a unifying framework to characterize V2V communication in a doubly stochastic VANET by averaging both the small- and large-scale fading effects as well as the (random) distance-dependent path losses.</P>
Bias-Stress-Stable Solution-Processed Oxide Thin Film Transistors
Jeong, Youngmin,Bae, Changdeuck,Kim, Dongjo,Song, Keunkyu,Woo, Kyoohee,Shin, Hyunjung,Cao, Guozhong,Moon, Jooho American Chemical Society 2010 ACS APPLIED MATERIALS & INTERFACES Vol.2 No.3
<P>We generated a novel amorphous oxide semiconductor thin film transistor (AOS-TFT) that has exellent bias-stress stability using solution-processed gallium tin zinc oxide (GSZO) layers as the channel. The cause of the resulting stable operation against the gate bias-stress was studied by comparing the TFT characteristics of the GSZO layer with a tin-doped ZnO (ZTO) layer that lacks gallium. By photoluminescence, X-ray photoelectron, and electron paramagnetic resonance spectroscopy, we found that the GSZO layer had a significantly lower oxygen vacancy, which act as trap sites, than did the ZTO film. The successful fabrication of a solution-processable GSZO layer reported here is the first step in realizing all-solution-processed transparent flexible transistors with air-stable, reproducible device characteristics.</P><P><B>Graphic Abstract</B> <IMG SRC='http://pubs.acs.org/appl/literatum/publisher/achs/journals/content/aamick/2010/aamick.2010.2.issue-3/am900787k/production/images/medium/am-2009-00787k_0001.gif'></P>