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Wonsoo Ji,Daechan Kim,Hyun Jun Kim,Beom-Hoan O,Se-Geun Park,El-Hang Lee,Seung Gol Lee IEEE 2005 IEEE photonics technology letters Vol.17 No.4
<P>A new characterization method employing near-field scanning optical microscope (NSOM) is proposed to measure the propagation characteristics of an optical channel waveguide having a solid-state cladding. For the measurement, the cladding material is replaced with the liquid having the same refractive index as that of the removed cladding. Replacing the solid-state cladding with the liquid enables the NSOM probe to reach the core-cladding interface without changing the boundary condition at the interface. The height of the probe immersed into the viscous liquid is done with the information from the surface profile of the naked core. The measured propagation characteristic shows a good agreement with the simulation result.</P>
Wonsoo Ji,Seung Gol Lee,Beom-hoan O,El-Hang Lee,Se-Geun Park,Seoung Jun Jang 한국물리학회 2005 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.47 No.1
Although both the topological information and the propagating characteristics of an optical waveguide device can simultaneously be measured with a Near-field Scanning Optical Microscope (NSOM), the structural distinctiveness of the device makes the height control of NSOM difficult. In order to resolve this difficulty, the hybrid method of controlling the gap between the NSOM probe and the device surface is newly proposed, this being based on the combination of a digital and an analog control method. It is shown that the proposed method is very efficient and stable in measuring a waveguide device with abrupt step coverage.