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A High Speed Fault Simulator for Sequential Circuits with Bidirectional Elements
Kang, M. S.,Shimosakoda, Y.,Iwashita, H.,Shirakawa, I. 대한전자공학회 1991 ICVC : International Conference on VLSI and CAD Vol.2 No.1
A high speed fault simulator is described, which can be applied to sequential circuits containing both uni-and bidirectional CMOS transmission gates. This simulator is distinctive in that it takes advantage of the parallel, deductive, and concurrent simulation schemes, in terms of evaluation of faulty gates, insertion of faults, and propagation of fault lists, respectively. A number of implementation results are also shown, which reveal the efficiency of the simulator especially for CMOS transmission gates.