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RISS 인기검색어
- 검색키워드
- 저자 : Sangeeta Sabharwal (검색결과 4 건)
- 무료
- 기관 내 무료
- 유료
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Test Set Generation for Pairwise Testing Using Genetic Algorithms
Sabharwal, Sangeeta,Aggarwal, Manuj Korea Information Processing Society 2017 Journal of information processing systems Vol.13 No.5
In software systems, it has been observed that a fault is often caused by an interaction between a small number of input parameters. Even for moderately sized software systems, exhaustive testing is practically impossible to achieve. This is either due to time or cost constraints. Combinatorial (t-way) testing provides a technique to select a subset of exhaustive test cases covering all of the t-way interactions, without much of a loss to the fault detection capability. In this paper, an approach is proposed to generate 2-way (pairwise) test sets using genetic algorithms. The performance of the algorithm is improved by creating an initial solution using the overlap coefficient (a similarity matrix). Two mutation strategies have also been modified to improve their efficiency. Furthermore, the mutation operator is improved by using a combination of three mutation strategies. A comparative survey of the techniques to generate t-way test sets using genetic algorithms was also conducted. It has been shown experimentally that the proposed approach generates faster results by achieving higher percentage coverage in a fewer number of generations. Additionally, the size of the mixed covering arrays was reduced in one of the six benchmark problems examined.
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Test Set Generation for Pairwise Testing Using Genetic Algorithms
Sangeeta Sabharwal,Manuj Aggarwal 한국정보처리학회 2017 Journal of information processing systems Vol.13 No.5
In software systems, it has been observed that a fault is often caused by an interaction between a small numberof input parameters. Even for moderately sized software systems, exhaustive testing is practically impossibleto achieve. This is either due to time or cost constraints. Combinatorial (t-way) testing provides a techniqueto select a subset of exhaustive test cases covering all of the t-way interactions, without much of a loss to thefault detection capability. In this paper, an approach is proposed to generate 2-way (pairwise) test sets usinggenetic algorithms. The performance of the algorithm is improved by creating an initial solution using theoverlap coefficient (a similarity matrix). Two mutation strategies have also been modified to improve theirefficiency. Furthermore, the mutation operator is improved by using a combination of three mutationstrategies. A comparative survey of the techniques to generate t-way test sets using genetic algorithms was alsoconducted. It has been shown experimentally that the proposed approach generates faster results by achievinghigher percentage coverage in a fewer number of generations. Additionally, the size of the mixed coveringarrays was reduced in one of the six benchmark problems examined.
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A Novel Approach for Deriving Test Scenarios and Test Cases from Events
Singh, Sandeep K.,Sabharwal, Sangeeta,Gupta, J.P. Korea Information Processing Society 2012 Journal of information processing systems Vol.8 No.2
Safety critical systems, real time systems, and event-based systems have a complex set of events and their own interdependency, which makes them difficult to test ma Safety critic Safety critical systems, real time systems, and event-based systems have a complex set of events and their own interdependency, which makes them difficult to test manually. In order to cut down on costs, save time, and increase reliability, the model based testing approach is the best solution. Such an approach does not require applications or codes prior to generating test cases, so it leads to the early detection of faults, which helps in reducing the development time. Several model-based testing approaches have used different UML models but very few works have been reported to show the generation of test cases that use events. Test cases that use events are an apt choice for these types of systems. However, these works have considered events that happen at a user interface level in a system while other events that happen in a system are not considered. Such works have limited applications in testing the GUI of a system. In this paper, a novel model-based testing approach is presented using business events, state events, and control events that have been captured directly from requirement specifications. The proposed approach documents events in event templates and then builds an event-flow model and a fault model for a system. Test coverage criterion and an algorithm are designed using these models to generate event sequence based test scenarios and test cases. Unlike other event based approaches, our approach is able to detect the proposed faults in a system. A prototype tool is developed to automate and evaluate the applicability of the entire process. Results have shown that the proposed approach and supportive tool is able to successfully derive test scenarios and test cases from the requirement specifications of safety critical systems, real time systems, and event based systems.
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