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        Enhanced exchange bias in magnetron-sputtered NieMneSbeAl ferromagnetic shape memory alloy thin films

        Rahul Barman,Sushil Kumar Singh,Davinder Kaur 한국물리학회 2014 Current Applied Physics Vol.14 No.12

        In the present study, the influence of aluminium (Al) addition on the martensite-austenite phase transformation and exchange bias of NieMneSb films have been investigated. NieMneSbeAl films with different Al concentration (~0e5.6%) were deposited by co-sputtering of NieMneSb and Al targets. Experimental results revealed the decrease in martensitic transformation temperature with increasing Al content upto a certain extent (3.3%) beyond which martensitic transformation was suppressed. Paramagnetic to ferromagnetic transition temperature (TC) also decreased with increasing Al concentration. Ni50Mn36.3Sb10.4Al3.3 thin film showed significant improvement in exchange bias field as compared to pure Ni50.3Mn36.9Sb12.8 thin film. This enhancement in the exchange bias field HEB ¼ 611 Oe at 10 K is attributed to the increase of AFM-FM interactions that result from the decrease of MneMn distance due to the incorporation of Al atoms. This behaviour is an additional property of the FSMA thin films apart from various other multifunctional properties and therefore, is of technological importance for their applications in magnetic storage devices. ©

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