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Local interaction imaging by SiGe quantum dot probe
정연길,Masato Hirade,Ryohei Kokawa,Hirofumi Yamada,Kei Kobayashi,Noriaki Oyabu,Toyoko Arai,Akira Sasahara,Masahiko Tomitori 한국물리학회 2012 Current Applied Physics Vol.12 No.2
Local interaction imaging of cleaved InAs surface (110) using a high aspect ratio (HAR) SiGe quantum dot (QD) probe was demonstrated by frequency-modulation mode noncontact atomic force microscopy under atmospheric pressure. The local contrast image with pronounced brightness is mainly attributed to no contact potential difference between the HAR SiGe-QD probe apex and the sample surface, and low frequency-change of the HAR SiGe-QD probe.