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        Analysis of a Non-Evaporable Getter of Ti-Al-Zr Thin Film with Enhanced Performance Used for Ultra-High Vacuum Generation

        Muhammad Khalid Alamgir,M. Ikram,Ghalib Hussain Mughal,Ghulam Asghar,Sha q ur Rehman,S. Qaseem,M. Kamran,Amir Ullah,Sartaj Khan 한국물리학회 2019 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.75 No.5

        Non-evaporable getter (NEG) thin films of Ti-Al-Zr and Ti-Zr were prepared on stainless-steel substrate by using the cathodic arc deposition technique. Scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), and in-situ X-ray photoelectron spectroscopy (XPS) were used to analyze the getter behavior of the non-evaporable getter thin films. The SEM images displayed the porous and rough surfaces of the thin films, which is an indication of high adsorption and sticking probabilities for the residual gases present in the chamber. The volume elemental composition of the thin films was measured by using EDX. The XRD patterns of the synthesized thin films indicated that the films had an amorphous nature and high structural stability. The in-situ X-ray photoelectron spectroscopy (XPS) studies revealed that the superficial layers disappeared when the non-evaporable getter of Ti-Al-Zr thin films was heated at a temperature below 250~$^\circ$C for 30 minutes, there by activating the surface. However, for Ti-Zr thin films, no reasonable activation was observed at 250~$^\circ$C. This outcome reveals that thin films of Ti-Al-Zr are good for reducing the outgassing and producing an ultra-high vacuum.

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        MeV carbon ion irradiation-induced changes in the electrical conductivity of silver nanowire networks

        Bushra Bari,Shehla Honey,Madhuku Morgan,Ishaq Ahmad,Rauf Khan,Arshad Muhammad,Khalid Alamgir,Shahzad Naseem,Maaza Malik 한국물리학회 2015 Current Applied Physics Vol.15 No.5

        MeV carbon ion irradiation-induced changes in the electrical conductivity of Silver nanowire (Ag-NW) networks is demonstrated systematically at different C+ ion fluences ranging from 1 × 1012 to 1 × 1016 ions/cm2 at room temperature. At low C+ ion fluences, the electrical conductivity of Ag-NWs decreases and subsequently increases with increase fluence. Finally, at high C+ ion fluences, conductivity again decreases. The variation in the electrical conductivity of Ag NW network is discussed after analysis using scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques. The observed increase in electrical conductivity is thought to be due to ion induced coalescence of Ag-NWs at contact position, which causes reduction of wire-wire contact resistance, while the decrease in electrical conductivity may be due to defect production by C+ ions into Ag-NWs. Ion beam technology is therefore a very promising technology that is capable of fabricating highly conductive Ag-NW networks for transparent electrodes. Moreover, a method for thinning, slicing and cutting of Ag-NWs using ion beam technology is also reported.

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