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Light Emission from Silicon Nanocrystals - Size Does Matter !
Robert G. Elliman,Andrew R. Wilkinson,Barry Luther-Davies,Marc G. Spooner,Marek Samoc,Max J. Lederer,Nathanael Smith,Tessica D.M. Weijers 한국물리학회 2004 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.45 No.3
A brief overview of two recent Si nanocrystal studies undertaken at the Australian National University is presented: recent work on hydrogen passivation of non-radiative defects and attempts to measure optical gain in waveguide structures. In the rst study, a generalized treatment of hydrogen passivation and desorption is employed to model the in uence of hydrogen on silicon nanocrystal luminescence. Values for reaction-rate parameters are determined from the model and found to be in excellent agreement with values previously determined for paramagnetic Si danglingbond defects (Pb-type centers) found at planar Si/SiO2 interfaces. In the second study, an attempt is made to measure optical gain in silicon nanocrystals by monitoring the intensity of a probe beam propagating in a waveguide structure containing silicon nanocrystals during photo-excitation of the nanocrystals. The probe beam is shown to be attenuated by the excitation demonstrating the dominance of absorptive processes. No gain was observed.