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- 저자 : Guanyu Li (검색결과 4 건)
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RESEARCH ON MILLIMETER WAVE RADAR SIMULATION MODEL FOR INTELLIGENT VEHICLE
Xin Li,Weiwen Deng,Sumin Zhang,Yaxin Li,Shiping Song,Shanshan Wang,Guanyu Wang 한국자동차공학회 2020 International journal of automotive technology Vol.21 No.2
Radar simulation models can effectively overcome the drawbacks of real vehicle experiment and speed up the development process of intelligent vehicle technologies based on millimeter wave radar via virtual testing. However, there are still many gaps between the radar model using in the virtual driving environment and the real radar. In this paper, a novel simulation model of intelligent vehicle millimeter wave radar is proposed. Based on the analysis of the real radar performance in typical application scenes, the radar model considers the mechanism and characteristics of the vehicle radar synthetically and a systematic radar modeling architecture with innovation is introduced. The highlights of this radar model include the design of the RCS simulation model for radar targets with both high accuracy and real-time performance, the establishment of the quantitative false alarm model, missed detection model and measurement error simulation model. Vast amounts of data collected by real vehicle radar are applied to fetch model parameters and verify the accuracy of the radar model. Simulation results show that the proposed model can reach both high reliability and computational efficiency.
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Density-based Outlier Detection in Multi-dimensional Datasets
Xite Wang,Zhixin Cao,Rongjuan Zhan,Mei Bai,Qian Ma,Guanyu Li 한국인터넷정보학회 2022 KSII Transactions on Internet and Information Syst Vol.16 No.12
Density-based outlier detection is one of the hot issues in data mining. A point is determined as outlier on basis of the density of points near them. The existing density-based detection algorithms have high time complexity, in order to reduce the time complexity, a new outlier detection algorithm DODMD (Density-based Outlier Detection in Multidimensional Datasets) is proposed. Firstly, on the basis of ZH-tree, the concept of micro-cluster is introduced. Each leaf node is regarded as a micro-cluster, and the micro-cluster is calculated to achieve the purpose of batch filtering. In order to obtain n sets of approximate outliers quickly, a greedy method is used to calculate the boundary of LOF and mark the minimum value as LOF i . Secondly, the outliers can filtered out by LOF i , the real outliers are calculated, and then the result set is updated to make the boundary closer. Finally, the accuracy and efficiency of DODMD algorithm are verified on real dataset and synthetic dataset respectively.
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Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials
Shim, Jaewoo,Bae, Sang-Hoon,Kong, Wei,Lee, Doyoon,Qiao, Kuan,Nezich, Daniel,Park, Yong Ju,Zhao, Ruike,Sundaram, Suresh,Li, Xin,Yeon, Hanwool,Choi, Chanyeol,Kum, Hyun,Yue, Ruoyu,Zhou, Guanyu,Ou, Yunbo American Association for the Advancement of Scienc 2018 Science Vol.362 No.6415
<P><B>Cleaving with a metal handle</B></P><P>Using adhesive tape to pull off monolayers of two-dimensional (2D) materials is now a well-established approach. However, the flakes tend to be micrometer scale, and the creation of multilayer stacks for device application can be challenging and time consuming. Shim <I>et al.</I> show that monolayers of a variety of 2D materials, including molybdenum disulfide and hexagonal boron nitride, can be cleaved from multilayers grown as 5-centimeter-diameter wafers. The multilayer is capped with a nickel layer, which can be used to pull off the entire grown stack. The bottom of the stack is again capped with nickel, and a second round of cleaving leaves the monolayer on the bottom nickel layer. The monolayers could be transferred to other surfaces, which allowed the authors to make field-effect transistors with high charge-carrier mobilities.</P><P><I>Science</I>, this issue p. 665</P><P>Although flakes of two-dimensional (2D) heterostructures at the micrometer scale can be formed with adhesive-tape exfoliation methods, isolation of 2D flakes into monolayers is extremely time consuming because it is a trial-and-error process. Controlling the number of 2D layers through direct growth also presents difficulty because of the high nucleation barrier on 2D materials. We demonstrate a layer-resolved 2D material splitting technique that permits high-throughput production of multiple monolayers of wafer-scale (5-centimeter diameter) 2D materials by splitting single stacks of thick 2D materials grown on a single wafer. Wafer-scale uniformity of hexagonal boron nitride, tungsten disulfide, tungsten diselenide, molybdenum disulfide, and molybdenum diselenide monolayers was verified by photoluminescence response and by substantial retention of electronic conductivity. We fabricated wafer-scale van der Waals heterostructures, including field-effect transistors, with single-atom thickness resolution.</P>
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