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Transport at surface nanostructures measured by four-tip STM
A. S. ShalabiShuji Hasegawa,Ichiro Shiraki,Fuhito Tanabe,Rei Hobara 한국물리학회 2002 Current Applied Physics Vol.2 No.6
For in situ measurements of local electrical conductivity of well-dened crystal surfaces in ultrahigh vacuum, we have developedtwo kinds of microscopic four-point probe methods. One is a.four-tip STM prober., in which independently driven four tips ofscanning tunneling microscope (STM) are used for four-point probe conductivity measurements. The probe spacing can be changedfrom 500 nm to 1 mm. The other one is monolithic micro-four-point probes, fabricated on silicon chips, whose probe spacing is xedaround severall m. These probes were installed in scanning-electron-microscopy/electron-diraction chambers, in which the struc-tures of sample surfaces and probe positions were in situ observed. The probes can be positioned precisely on aimed areas on thehanced compared with macroscopic four-point probe method. Then the conduction through the topmost atomic layers (surface-stateconductivity) and inuence of atomic steps upon conductivity could be directly measured. The STM prober is mainly described here.. 2002 Published by Elsevier Science B.V.