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Transmission electron microscopy without aberrations: Applications to materials science
Angus Kirkland,Lan-Yun Chang,Sarah Haigh,Crispin Hetherington 한국물리학회 2008 Current Applied Physics Vol.8 No.3,4
Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes.Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of imagesoer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration cor-rected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses.bining direct and indirect methods.