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RISS 인기검색어
- 검색키워드
- 저자 : Bachilo, Sergei M. (검색결과 2 건)
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Meng, Wei,Bachilo, Sergei M.,Parol, Jafarali,Weisman, R. Bruce,Nagarajaiah, Satish Techno-Press 2022 Structural monitoring and maintenance Vol.9 No.3
This study explores the use of the recently developed "strain-sensing smart skin" (S<sup>4</sup>) method for noncontact strain measurements on cement-based samples. S<sup>4</sup> sensors are single-wall carbon nanotubes dilutely embedded in thin polymer films. Strains transmitted to the nanotubes cause systematic shifts in their near-infrared fluorescence spectra, which are analyzed to deduce local strain values. It is found that with cement-based materials, this method is hampered by spectral interference from structured near-infrared cement luminescence. However, application of an opaque blocking layer between the specimen surface and the nanotube sensing film enables interference-free strain measurements. Tests were performed on cement, mortar, and concrete specimens with such modified S<sup>4</sup> coatings. When specimens were subjected to uniaxial compressive stress, the spectral peak separations varied linearly and predictably with induced strain. These results demonstrate that S<sup>4</sup> is a promising emerging technology for measuring strains down to ca. 30 𝜇𝜀 in concrete structures.
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Efficient Spectrofluorimetric Analysis of Single-Walled Carbon Nanotube Samples
Rocha, John-David R.,Bachilo, Sergei M.,Ghosh, Saunab,Arepalli, Sivaram,Weisman, R. Bruce American Chemical Society 2011 ANALYTICAL CHEMISTRY - Vol.83 No.19
<P>A new method and instrumentation are described for rapid compositional analysis of single-walled carbon nanotube (SWCNT) samples. The customized optical system uses multiple fixed-wavelength lasers to excite NIR fluorescence from SWCNTs individualized in aqueous suspensions. The emission spectra are efficiently captured by a NIR spectrometer with InGaAs multichannel detector and then analyzed by a computer program that consults a database of SWCNT spectral parameters. The identities and relative abundances of semiconducting SWCNTs species are quickly deduced and displayed in graphs and tables. Results are found to be consistent with those based on manual interpretation of full excitation–emission scans from a conventional spectrofluorometer. The new instrument also measures absorption spectra using a broadband lamp and multichannel spectrometers, allowing samples to be automatically characterized by their emission efficiencies. The system provides rapid data acquisition and is sensitive enough to detect the fluorescence of a few picograms of SWCNTs in ∼50 μL sample volumes.</P><P><B>Graphic Abstract</B> <IMG SRC='http://pubs.acs.org/appl/literatum/publisher/achs/journals/content/ancham/2011/ancham.2011.83.issue-19/ac2014788/production/images/medium/ac-2011-014788_0005.gif'></P><P><A href='http://pubs.acs.org/doi/suppl/10.1021/ac2014788'>ACS Electronic Supporting Info</A></P>
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