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Convolutional Encoder-Decoder를 이용한 머신비전 영상의 픽셀 단위 검사에 관한 연구
조희연(HeeYeon Jo),김경실(KyungSil Kim),최은정(EunJeong Choi),김정태(JeongTae Kim) 대한전자공학회 2018 대한전자공학회 학술대회 Vol.2018 No.11
For inspecting defects in display devices, we study machine learning based machine vision system using images of the display devices. Specifically, we investigate two convolutional encoder-decoder based methods: one network has subsampling layers while the other has no subsampling layer. The methods have less parameters than existing convolutional encoder-decoder based methods for image classification. Experimental results show that the convolutional encoder-decoder with sub-sampling layer performs better than that of without sub-sampling layer.