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X-線粉末廻折法에 의한 Cadmiun Sufide 試料의 定量定性分析
徐日煥,金永銓,鄭濟永 충남대학교 자연과학연구소 1983 忠南科學硏究誌 Vol.10 No.1
The 32 X-ray diffraction intensity peaks for the cadmium sulfide powder (99.999% purity),which is an industrially important semiconductor, were obtained rotating 2θh㎘ Bragg angle of X-ray diffractometer with Cu Kα radiation from 20 to 120 degrees by θ-2θ scan technique. Each reflecting plane identified by means of the graphical and analytical methods indicated that there are two different kinds of phases : hexagonal close-packed structure with a=4.13Å, c=6.75Å and face-centered cubic structure with a=5.82Å. In order to account for the result of two molecules per unit hexagonal cell and four molecules per unit cubic cell, they should have the wurtzite form and zinc blende form respectively. The quantitative analysis by the direct comparison method has shown that this sample contains approximately 86.3 percent wurtzite form and the rest 13.7 percent zinc blende form of CdS. The correct result has been proved by the good agreement between the experimental and theoretical integrated intensities.