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        Radial junction silicon solar cells with micro-pillar array and planar electrode interface for improved photon management and carrier extraction

        Vineet Kumar Singh,Jampana Nagaraju,Sushobhan Avasthi 한국물리학회 2019 Current Applied Physics Vol.19 No.3

        We demonstrate radial p-n junction silicon solar cells with micro-pillar array with higher short-circuit current and open-circuit voltage than comparable planar silicon solar cells. Micro-pillar array, fabricated by RIE, acts as an effective anti-reflection coating for visible light with less than 6% reflection. Compared to devices with planar surface, devices with micro-pillar array show a 27% enhancement in short circuit current. The radial p-n junction of the micro-pillars also improves extraction probability of the photogenerated carriers, which further increases the short circuit current. Typically, micro-pillar solar cells suffer from high recombination losses at the Si/metal interface, resulting in poor VOC. Our devices prevent these recombination losses by planarizing the Si/ metal interface, leading to an open circuit voltage of 622 mV, the highest ever reported for micro-pillar solar cells. This planarized contact also reduces the series resistance associated with radial junctions, leading to series resistance of ≤0.50 Ω-cm2 and fill factors up to 76.7%.

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        Large grained and high charge carrier lifetime CH3NH3PbI3 thin-films: implications for perovskite solar cells

        Arun Singh Chouhan,Naga Prathibha Jasti,Shreyash Hadke,Srinivasan Raghavan,Sushobhan Avasthi 한국물리학회 2017 Current Applied Physics Vol.17 No.10

        Spin coated perovskite thin films are known to have an issue of pinholes & poor morphology control which lead to poor device-to-device repeatability, that is an impediment to scale-up. In this work, Methylamine vapor annealing process is demonstrated which consistently leads to high-quality perovskite thin-films with an average grain-size of 10e15 mm. The improvement in film morphology enables improvement in effective carrier recombination lifetime, from 21 ms in as-deposited films to 54 ms in vapor-annealed films. The annealed films with large-grains are also more stable in ambient conditions. Devices made on annealed perovskite films are very consistent, with a standard deviation of only 0.7%. Methylamine vapor annealing process is a promising method of depositing large-grain CH3NH3PbI3 films with high recombination lifetime and the devices with improved performance.

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