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A Finite Element Model of Near-Field Scanning Microwave Microscopy
Barry Friedman,이기진,Brian Oetiker 한국물리학회 2008 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.52 No.3
A model of a near field scanning microwave microscope has been investigated via numerical simulation using the finite element method. Despite being simplified so as to be axially symmetric, the model is in qualitative agreement with measurements on non-conducting samples. As well as frequency shifts, the reflection coefficient S11 has been calculated as a function of frequency with no adjustable parameters. A model of a near field scanning microwave microscope has been investigated via numerical simulation using the finite element method. Despite being simplified so as to be axially symmetric, the model is in qualitative agreement with measurements on non-conducting samples. As well as frequency shifts, the reflection coefficient S11 has been calculated as a function of frequency with no adjustable parameters.
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