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        A Data Driven Approach to Identify Optimal Thermal Parameters for Finite Element Analysis of Electric-Assisted Deformation Processes

        Jai Tiwari,Bashista Kumar Mahanta,Hariharan Krishnaswamy,Sivasrinivasu Devadula,Murugaiyan Amirthalingam 대한금속·재료학회 2023 METALS AND MATERIALS International Vol.29 No.8

        Application of electric current pulses while deforming a material, commonly referred to as electric-assisted forming (EAF), isknown to have desirable effects over its formability. In the finite element simulation of this electric-assisted deformation, thetime-temperature profile is obtained by providing various temperature dependent thermo-physical properties of the material. Out of all the required properties for such analysis, effective heat transfer coefficient and Joule heat fraction are sensitive tothe microstructure of the material, geometry of the specimen and the ambient conditions. Generally, these coefficients areidentified by iterative FE simulations. A clear methodology to estimate these parameters has not been established yet. In thepresent work, a procedure is developed using a genetically evolved meta-model of the time-temperature profile, which isexperimentally obtained from the pulsed current assisted uniaxial tension and compression tests. For this purpose, variousmulti-objective optimization techniques such as BioGP, EvoNN and cRVEA have been utilized to estimate the temperatureprofile in each case. It is shown that the tri-objective optimization procedure predicts the experimental temperature profilewith greater accuracy (within ± 5%) and is best suited to obtain the thermal modelling parameters of electric-assisted deformation,than other optimization techniques used in this work.

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        UnveilingSources of Stripe Rust Resistance in Diverse Wheat (Triticum Aestivum L.) Germplasm Using Narrow Down Methodology: A Proof of Concept

        Saurabh Badoni,Reeku Chaudhary,Ravi Shekhar,Shweta Badoni,Ekhlaque Ahmad,Rishi Pal Gangwar,Kashi Nath Tiwari,Rajendra Singh Rawat,Deepshikha,Jai Prakash Jaiswal 한국작물학회 2017 Journal of crop science and biotechnology Vol.20 No.5

        Stripe rust of wheat caused by the fungal pathogen is a destructive foliar disease of wheat. Thus, it is crucial step to characterize the resistant germplasm for stripe rust in a diverse germplasm pool for their ultimate utilization in efficient crop rust resistance breeding. In the present study, we followed two pronged strategies involving integrated phenotypic and molecular characterization of 440 diverse wheat germplasm lines for rust resistance. The germplasm panel was extensively evaluated in field epiphytotic conditions during two consecutive years. After rigorous screening, 72 accessions were successfully revealed as resistant to moderately resistant to stripe rust. Subsequently, entries were then evaluated for their field agronomicperformances, considering prerequisites for serving as a donor germplasm,particularly for yield and 33 potential rust-resistant accessions were identified. Furthermore, to detect the sources of resistance, accessions were molecular characterized for potential race-specific resistance genes Yr5, Yr10,Yr15, and effective adult plant resistance (APR) gene Lr34/Yr18/pm38. We identified the 22 accessions possessing one or more single resistance genes and two accessions were observed with at least three of them. Moreover, Lr34/Yr18/pm38 was determined to confer resistance when observed along with any of the race-specific genes. Thus, the study not only provides proof of concept methodology to identify candidate resistant sources from large germplasm collections but simultaneouslyconfirmed the contribution of combining race-specific andnon-specific APR genes. The finding could further assist in the potential deployment of resistant genes directly into the stripe rust breeding program by involving marker-assisted approaches.

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