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RISS 인기검색어
- 검색키워드
- 저자 : Dahlem, Marcus S. (검색결과 2 건)
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Sylvia Weis,Tim A. Ludwig,Omar Bahassan,Philipp Gild,Malte W. Vetterlein,Margit Fisch,Roland Dahlem,Valentin Maurer 대한배뇨장애요실금학회 2023 International Neurourology Journal Vol.27 No.2
Purpose: This study investigated the functional outcomes and complication rates of cuff downsizing for the treatment of recurrent or persistent stress urinary incontinence (SUI) in men after the implantation of an artificial urinary sphincter (AUS). Methods: Data from our institutional AUS database spanning the period from 2009 to 2020 were retrospectively analyzed. The number of pads per day was determined, a standardized quality of life (QoL) questionnaire and the International Consultation on Incontinence Questionnaire (ICIQ) were administered, and postoperative complications according to the ClavienDindo classification were analyzed. Results: Out of 477 patients who received AUS implantation during the study period, 25 (5.2%) underwent cuff downsizing (median age, 77 years; interquartile range [IQR], 74–81 years; median follow-up, 4.4 years; IQR, 3–6.9 years). Before downsizing, SUI was very severe (ICIQ score 19–21) or severe (ICQ score 13–18) in 80% of patients, moderate (ICIQ score 6–12) in 12%, and slight (ICIQ score 1–5) in 8%. After downsizing, 52% showed an improvement of >5 out of 21 points. However, 28% still had very severe or severe SUI, 48% had moderate SUI, and 20% had slight SUI. One patient no longer had SUI. In 52% of patients, the use of pads per day was reduced by ≥50%. QoL improved by >2 out of 6 points in 56% of patients. Complications (infections/urethral erosions) requiring device explantation occurred in 36% of patients, with a median time to event of 14.5 months. Conclusions: Although cuff downsizing carries a risk of AUS explantation, it can be a valuable treatment option for selected patients with persistent or recurrent SUI after AUS implantation. Over half of patients experienced improvements in symptoms, satisfaction, ICIQ scores, and pad use. It is important to inform patients about the potential risks and benefits of AUS to manage their expectations and assess individual risks.
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Howells, Calvyn T.,Saylan, Sueda,Kim, Haeri,Marbou, Khalid,Aoyama, Tetsua,Nakao, Aiko,Uchiyama, Masanobu,Samuel, Ifor D. W.,Kim, Dong-Wook,Dahlem, Marcus S.,André,, Pascal The Royal Society of Chemistry 2018 Journal of Materials Chemistry A Vol.6 No.33
<P>Poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) is widely used to build optoelectronic devices. However, as a hygroscopic water-based acidic material, it brings major concerns for stability and degradation, resulting in an intense effort to replace it in organic photovoltaic (OPV) devices. In this work, we focus on the perfluorinated ionomer (PFI) polymeric additive to PEDOT:PSS. We demonstrate that it can reduce the relative amplitude of OPV device burn-in, and find two distinct regimes of influence. At low concentrations there is a subtle effect on wetting and work function, for instance, with a detrimental impact on the device characteristics, and above a threshold it changes the electronic and device properties. The abrupt threshold in the conducting polymer occurs for PFI concentrations greater than or equal to the PSS concentration and was revealed by monitoring variations in transmission, topography, work-function, wettability and OPV device characteristics. Below this PFI concentration threshold, the power conversion efficiency (PCE) of OPVs based on poly(3-hexylthiophene-2,5-diyl):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) are impaired largely by low fill-factors due to poor charge extraction. Above the PFI concentration threshold, we recover the PCE before it is improved beyond the pristine PEDOT:PSS layer based OPV devices. Supplementary to the performance enhancement, PFI improves OPV device stability and lifetime. Our degradation study leads to the conclusion that PFI prevents water from diffusing to and from the hygroscopic PEDOT:PSS layer, which slows down the deterioration of the PEDOT:PSS layer and the aluminum electrode. These findings reveal mechanisms and opportunities that should be taken into consideration when developing components to inhibit OPV degradation.</P>
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