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Cho, Jung‐,Il,Burla, Bo,Lee, Dae‐,Woo,Ryoo, Nayeon,Hong, Soon‐,Kwan,Kim, Hyun‐,Bi,Eom, Joon‐,Seob,Choi, Sang‐,Bong,Cho, Man‐,Ho,Bhoo, Seong Hee,Hahn, Tae Blackwell Publishing Ltd 2010 The New phytologist Vol.186 No.3
<P><B>Summary</B></P><P><P>In Arabidopsis, the compartmentation of sugars into vacuoles is known to be facilitated by sugar transporters. However, vacuolar sugar transporters have not been studied in detail in other plant species.</P><P>To characterize the rice (<I>Oryza sativa</I>) tonoplast monosaccharide transporters, <I>OsTMT1</I> and <I>OsTMT2</I>, we analysed their subcellular localization using green fluorescent protein (GFP) and expression patterns using reverse‐transcription polymerase chain reaction (RT‐PCR), performed histochemical β‐glucuronidase (GUS) assay and <I>in situ</I> hybridization analysis, and assessed sugar transport ability using isolated vacuoles.</P><P>Expression of OsTMT–GFP fusion protein in rice and Arabidopsis revealed that the OsTMTs localize at the tonoplast. Analyses of <I>OsTMT</I> promoter‐<I>GUS</I> transgenic rice indicated that <I>OsTMT1</I> and <I>OsTMT2</I> are highly expressed in bundle sheath cells, and in vascular parenchyma and companion cells in leaves, respectively. Both genes were found to be preferentially expressed in the vascular tissues of roots, the palea/lemma of spikelets, and in the main vascular tissues and nucellar projections on the dorsal side of the seed coats. Glucose uptake studies using vacuoles isolated from transgenic mutant Arabidopsis (<I>tmt1‐2‐3</I>) expressing <I>OsTMT1</I> demonstrated that OsTMTs are capable of transporting glucose into vacuoles.</P><P>Based on expression analysis and functional characterization, our present findings suggest that the <I>OsTMTs</I> play a role in vacuolar glucose storage in rice.</P></P>
Wolfram Lyda,Avinash Burla,Tobias Haist,Marc Gronle,Wolfgang Osten 한국정밀공학회 2012 International Journal of Precision Engineering and Vol. No.
In this contribution the complete implementation of an automated multiscale measurement system (AMMS) for the inspection of micro lenses and micro electromechanical systems is presented. The system uses an adaptable active exploration strategy to balance the conflict between lateral resolution, axial accuracy and measurement duration. It is equipped with several sensors with different fields of view, resolutions and accuracies. The sensors are linked flexibly during the measurement process by image processing and data fusion algorithms. Image processing algorithms are used to identify defect indicators which represent possible unresolved defects in the current sensor scale. The information, gathered by the indicator algorithms, results in new regions of interest and knowledge about the specimen feature which is needed to select and to condition more finely scaled sensors, and to trigger higher resolved measurements in the next scale. For the automated adaption and parameter optimization of the system to a measurement task, an assistant system for sensor and algorithm selection is used. We present the necessary components for automatic task adaptation and active exploration of micro lenses and micro electromechanical systems (MEMS). Inspection results for MEMS-wafer and micro lens arrays and a performance analysis are discussed.