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Quality-Related Process Monitoring Based on a Bayesian Classifier
Hongping Zhou,Xiangyu Kong,Jiayu Luo,Qiusheng An,Hongzeng Li 한국정밀공학회 2023 International Journal of Precision Engineering and Vol.24 No.12
Multivariate statistical analysis approaches are extensively employed in process monitoring because they can effectively detect abnormal conditions in industrial processes. However, both Gaussian and non-Gaussian variables are often present in industrial processes. A single multivariate statistical process monitoring method often has difficulty simultaneously dealing with variable information of mixed distribution characteristics. This paper proposes a multivariate quality-related process monitoring method based on a Bayesian classifier to address this issue. The proposed method separates the variables into Gaussian and non-Gaussian parts using a Jarque–Bera test. Then, Gaussian and non-Gaussian properties are extracted through modified kernel partial least squares and kernel independent component analysis. After feature extraction, a Bayesian-based classifier relevance vector machine is constructed to monitor quality-related information of the process, which avoids the construction of a threshold in conventional methods and offsets the drawbacks of insufficient single statistic information. A numerical simulation and the Tennessee-Eastman process verify the effectiveness of the method.
Electron cyclotron emission imaging in tokamak plasmas.
Munsat, Tobin,Domier, Calvin W,Kong, Xiangyu,Liang, Tianran,Luhmann, Neville C,Tobias, Benjamin J,Lee, Woochang,Park, Hyeon K,Yun, Gunsu,Classen, Ivo G J,Donné,, Anthony J H Optical Society of America 2010 Applied Optics Vol.49 No.19
<P>We discuss the recent history and latest developments of the electron cyclotron emission imaging diagnostic technique, wherein electron temperature is measured in magnetically confined plasmas with two-dimensional spatial resolution. The key enabling technologies for this technique are the large-aperture optical systems and the linear detector arrays sensitive to millimeter-wavelength radiation. We present the status and recent progress on existing instruments as well as new systems under development for future experiments. We also discuss data analysis techniques relevant to plasma imaging diagnostics and present recent temperature fluctuation results from the tokamak experiment for technology oriented research (TEXTOR).</P>