This thesis considers the step-stress accelerated life test plans with two stresses. The log lifetimes of products are assumed to follow a location-scale family, which is either a smallest extreme value distribution or normal distribution. It is assum...
This thesis considers the step-stress accelerated life test plans with two stresses. The log lifetimes of products are assumed to follow a location-scale family, which is either a smallest extreme value distribution or normal distribution. It is assumed that (i) the relation between the location parameter and the stresses involves two linear and one product terms, (ii) the scale parameter is independent of the levels of the stresses, and (iii) a cumulative exposure model for the effect of changing stress holds. The asymptotic variance of the log 100pth percentile at use condition is obtained by the method of maximum likelihood. The asymptotic variance of step-stress test plans are compared with nondegenerate plan.