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Electrical and Structural Properties of High-K HfO~2 on Si~1~-~XGe~x Substrates
Hwang, C.; Park, T.; Kim, J.; Hong, S. H.; Seo, M.; Jang, J. H. Pennington, N.J.; Electrochemical Society 2006 p.3-8
Characterization of Atomic-Beam Deposited GeO~1~-~xN~x/HfO~2 Stacks on Ge
Houssa, M.; Conard, T.; Van Steenbergen, J.; Mavrou, G.; Panayiotatos, Y.; Dimoulas, T.; Meuris, M.; Caymax, M.; Heyns, M.; Nicholas, G. Pennington, N.J.; Electrochemical Society 2006 p.9-16
Effect of Nitridation on Ge/HfO~2 Interface
Garg, R.; Misra, D.; Guha, S. Pennington, N.J.; Electrochemical Society 2006 p.17-26
Interface Trap Characterization and Fermi Level Pinning in Si-Passivated Ge/HfO~2 Capacitors
Martens, K.; Kaczer, B.; Roussel, P.; Groeseneken, G.; Maes, H. Pennington, N.J.; Electrochemical Society 2006 p.27-32
Mahapatra, R.; Poolamai, N.; Wright, N.; Chakraborty, A. K.; Coleman, K. S.; Das, K.; Ray, S. K.; Coleman, P.; Burrows, P. Pennington, N.J.; Electrochemical Society 2006 p.33-40
Advanced High K Dielectrics for Nano Electronics - Science and Technologies
Hong, M.; Kwo, J. Pennington, N.J.; Electrochemical Society 2006 p.41-62
High-K Materials for Nonvolatile Memories
Specht, M.; Staedele, M.; Hofmann, F.; Reisinger, H.; Grieb, M.; Risch, L. Pennington, N.J.; Electrochemical Society 2006 p.63-74
High-k Materials for Tunnel Barrier Engineering in Floating-Gate Flash Memories
Blomme, P.; Govoreanu, B.; Rosmeulen, M.; Akheyar, A.; Haspeslagh, L.; De Vos, J.; Lorenzini, M.; Van Houdt, J.; De Meyer, K. Pennington, N.J.; Electrochemical Society 2006 p.75-90
High-k Materials in Flash Memories
Alessandri, M.; Piagge, R.; Alberici, S.; Bellandi, E.; Caniatti, M.; Ghidini, G.; Modelli, A.; Pavia, G.; Ravizza, E.; Sebastiani, A. Pennington, N.J.; Electrochemical Society 2006 p.91-106
Characterization of Charge Storage in ALD Nanolaminates
Seidel, T. E.; Srivastava, A.; Zhang, Z.; Dimitrova, T.; Londergan, A. R.; Karim, Z. Pennington, N.J.; Electrochemical Society 2006 p.107-116