1 오승찬, "즉발감마선에 의한 상용전자소자의 피해현상분석 연구" 대한전기학회 61 (61): 1448-1453, 2012
2 김종열, "상용 반도체 소자를 이용한 내방사선 원전 센서신호 공통회로 연구" 대한전기학회 63 (63): 1248-1252, 2014
3 H. J. Barnaby, "Total-Ionizing-Dose Effects in Modern CMOS Technologies" 53 (53): 3103-3120, 2006
4 T. R. Oldham, "Total Ionizing Dose Effects in MOS Oxides and Devices" 50 (50): 483-496, 2003
5 G. C. Messenger, "The Effects of Radiation On Electronic Systems" Springer Press 1992
6 Li Chen, "Study of N-Channel MOSFETs with an Enclosed-Gate Layout in a 0.18um CMOS technology" 52 (52): 861-867, 2005
7 T. R. Oldham, "Post-Irradiation Effects in Field Oxide Isolation structures" 34 (34): 1184-1189, 1987
8 A. S. Sedra, "Microelectronic Circuits, 5th ed" Oxford 2004
9 H. M. Hashemian, "Maintenance of Process Instrumentation in Nuclear Power Plants" Springer Press 2006
10 이민웅, "Implementation of a Radiation-hardened I-gate n-MOSFET and Analysis of its TID(Total Ionizing Dose) Effects" 대한전기학회 12 (12): 1619-1626, 2017
1 오승찬, "즉발감마선에 의한 상용전자소자의 피해현상분석 연구" 대한전기학회 61 (61): 1448-1453, 2012
2 김종열, "상용 반도체 소자를 이용한 내방사선 원전 센서신호 공통회로 연구" 대한전기학회 63 (63): 1248-1252, 2014
3 H. J. Barnaby, "Total-Ionizing-Dose Effects in Modern CMOS Technologies" 53 (53): 3103-3120, 2006
4 T. R. Oldham, "Total Ionizing Dose Effects in MOS Oxides and Devices" 50 (50): 483-496, 2003
5 G. C. Messenger, "The Effects of Radiation On Electronic Systems" Springer Press 1992
6 Li Chen, "Study of N-Channel MOSFETs with an Enclosed-Gate Layout in a 0.18um CMOS technology" 52 (52): 861-867, 2005
7 T. R. Oldham, "Post-Irradiation Effects in Field Oxide Isolation structures" 34 (34): 1184-1189, 1987
8 A. S. Sedra, "Microelectronic Circuits, 5th ed" Oxford 2004
9 H. M. Hashemian, "Maintenance of Process Instrumentation in Nuclear Power Plants" Springer Press 2006
10 이민웅, "Implementation of a Radiation-hardened I-gate n-MOSFET and Analysis of its TID(Total Ionizing Dose) Effects" 대한전기학회 12 (12): 1619-1626, 2017
11 N. Saks, "Generation of interface states by ionizing radiation in very thin MOS oxides" 33 (33): 1185-1190, 1986
12 D. M. Fleetwood, "Effects of oxide traps, interface traps, and 'border traps' on metal-oxide-semiconductor devices" 73 : 5058-5074, 1993
13 M. S. Lee, "Dummy Gate-Assisted n-MOSFET Layout for a Radiation-Tolerant Integrated Circuit" 60 (60): 3084-3091, 2013
14 Y. Li et al., "Anomalous radiation effects in fully depleted SOI MOSFETs fabricated on SIMOX" 48 : 2146-2151, 2001
15 W. J. Snoeys, "A New NMOS Layout Structure for Radiation Tolerance" 49 (49): 2002