t-분포를 이용한 의사-전체검사에 관한 연구 = A Study on a New Pseudo-exhaustive Testing using t-distribution

다국어 초록 (Multilingual Abstract)

This paper deals with the path sensitization algorithm from PI to PO center on the nodes of high testability mainstay when CUT is tested by pseudo-exhaustive testing.
Focusing on the defined nodes of high testability mainstay, we performed the singular cover and consistency operation to the forward and backward logic gates. Thus, we easily generated the pseudo-exhaustive test patterns.
As a result, (1-α) region has 0.1579 and the pseudo-exhaustive test patterns are least generated and the rate of test pattern is 1.22%, compared with exhaustive testing. (1-α region has 0.2368 and this result exhibits the optimal performance of the singular cover and consistency operation. Applying the generated pseudo-exhaustive test patterns to the stuck at faults existing on the inputs and internal nodes in CUT, we verified this performance on the output. Thus, it is confirmed that fuctional testing of the proposed path sensitization algorithm is very useful.