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      Finite Element Analysis of Crystalline Silicon Solar Cell in Screen Printing Process by using Taguchi Method

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      https://www.riss.kr/link?id=A104245387

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      다국어 초록 (Multilingual Abstract) kakao i 다국어 번역

      Screen printing is one of key processes in manufacturing crystalline silicon solar cells. The performance of screen printing process is characterized by various types of variables. The effects of squeegee pressure, angle and speed, and snap-off on the stress distributions of silicon wafers are focused. The breakage rate is evaluated by using the stress level during the screen printing process.
      A finite element analysis is performed according to Taguchi design of experiments in this study. The factors with the most effect on wafer quality and productivity are analyzed and optimal screen printing conditions were selected for a lower breakage rate.
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      Screen printing is one of key processes in manufacturing crystalline silicon solar cells. The performance of screen printing process is characterized by various types of variables. The effects of squeegee pressure, angle and speed, and snap-off on the...

      Screen printing is one of key processes in manufacturing crystalline silicon solar cells. The performance of screen printing process is characterized by various types of variables. The effects of squeegee pressure, angle and speed, and snap-off on the stress distributions of silicon wafers are focused. The breakage rate is evaluated by using the stress level during the screen printing process.
      A finite element analysis is performed according to Taguchi design of experiments in this study. The factors with the most effect on wafer quality and productivity are analyzed and optimal screen printing conditions were selected for a lower breakage rate.

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      참고문헌 (Reference)

      1 김완두, "고무부품의 유한요소해석을 위한 재료시험 및 비선형 재료물성에 관한 연구" 대한기계학회 28 (28): 848-859, 2004

      2 Dubey, G. C., "The squeegee in printing of electronic circuits" 14 (14): 427-429, 1975

      3 Park, K. C., "The effect of material and process variables on the stamping formability of sheet materials" 51 (51): 64-78, 1995

      4 Solar and Energy, "Solar cell metal paste technology and market forecast" Solar and Energy 70-83, 2010

      5 Dubey, G. C., "Screens for screen printing of electronic circuits" 13 (13): 203-207, 1974

      6 Neidert, M., "Screen-printing simulation study on solar cell front side Ag paste" 2008

      7 Kumar, S. L., "Plane strain singular field around interface edge using moir´e interferometry" 2004

      8 Provance, J. D., "Particle size effects on viscosity of silver pastes - A manufacturer’s view" 6 (6): 195-214, 1983

      9 Cao, K., "Optimization of screen printing process" 2006

      10 Vodenitcharova, T., "Mechanics prediction of the fracture pattern on scratching wafers of single crystal silicon" 60 (60): 4448-4460, 2012

      1 김완두, "고무부품의 유한요소해석을 위한 재료시험 및 비선형 재료물성에 관한 연구" 대한기계학회 28 (28): 848-859, 2004

      2 Dubey, G. C., "The squeegee in printing of electronic circuits" 14 (14): 427-429, 1975

      3 Park, K. C., "The effect of material and process variables on the stamping formability of sheet materials" 51 (51): 64-78, 1995

      4 Solar and Energy, "Solar cell metal paste technology and market forecast" Solar and Energy 70-83, 2010

      5 Dubey, G. C., "Screens for screen printing of electronic circuits" 13 (13): 203-207, 1974

      6 Neidert, M., "Screen-printing simulation study on solar cell front side Ag paste" 2008

      7 Kumar, S. L., "Plane strain singular field around interface edge using moir´e interferometry" 2004

      8 Provance, J. D., "Particle size effects on viscosity of silver pastes - A manufacturer’s view" 6 (6): 195-214, 1983

      9 Cao, K., "Optimization of screen printing process" 2006

      10 Vodenitcharova, T., "Mechanics prediction of the fracture pattern on scratching wafers of single crystal silicon" 60 (60): 4448-4460, 2012

      11 Zhang, T. Y., "Measurements of residual stresses in thin films deposited on silicon wafers by indentation fracture" 47 (47): 3869-3878, 1999

      12 Vrinceanu, I. D., "Measurement of residual stress in single crystal silicon wafers" 297-301, 2002

      13 "KS M ISO 815-1:2010, Rubber, vulcanized or thermoplastic- Determination of compression set - Part 1: At ambient or elevated temperatures"

      14 "KS M 6518:2006, Physical test methods for vulcanized rubber"

      15 Kim, K. H., "Introduction to solar cell production" Dooyangsa 124-133, 2011

      16 윤해성, "Geometric Optimization of Micro Drills using Taguchi Methods and Response Surface Methodology" 한국정밀공학회 12 (12): 871-875, 2011

      17 McLaughlin, J. C., "Fracture of silicon wafers" 85 (85): 83-90, 1987

      18 Shin, B. G., "Fracture behavior of ultra thin single crystalline Si wafer for solar cell" Seoul National University of Science and Technology 2010

      19 Buzby, D., "Fine line screen printing of thick film pastes on silicon solar cells" International Microelectronics Assembly and Packaging Society 2008

      20 Basham, D. L., "Design: Piers and wharves" United Facilities Criteria 131-133, 2005

      21 "ABAQUS, ABAQUS Version 6.10-1 Documentation"

      22 Shin, J. H., "A study on the reproduction of fine lines according to angle change in screen printing" 11 (11): 1-16, 1993

      23 Min, K. J., "A study on method to form PDP barrier rid by screen printing" 120-126, 2001

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2008-06-23 학회명변경 영문명 : Korean Society Of Precision Engineering -> Korean Society for Precision Engineering KCI등재
      2006-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2005-05-30 학술지명변경 한글명 : 한국정밀공학회 영문논문집 -> International Journal of the Korean of Precision Engineering KCI등재후보
      2005-05-30 학술지명변경 한글명 : International Journal of the Korean of Precision Engineering -> International Journal of Precision Engineering and Manufacturing
      외국어명 : International Journal of the Korean of Precision Engineering -> International Journal of Precision Engineering and Manufacturing
      KCI등재후보
      2005-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2003-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 1.38 0.71 1.08
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.92 0.85 0.583 0.11
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