PEDOT:PSS is a widely used hole transport layer (HTL) in organic light-emitting diode (OLED) devices, where lowering the energy barrier with the indium tin oxide (ITO) substrate is critical for enhancing hole injection efficiency. This study examines ...
PEDOT:PSS is a widely used hole transport layer (HTL) in organic light-emitting diode (OLED) devices, where lowering the energy barrier with the indium tin oxide (ITO) substrate is critical for enhancing hole injection efficiency. This study examines the wavelength-dependent effects of hydrogen plasma emission, with emphasis on vacuum ultraviolet (VUV) photons, on PEDOT:PSS thin films. Photon irradiation was conducted across the visible (VIS), ultraviolet (UV), and VUV spectral regions, as well as under direct plasma exposure. VUV treatment induced a 0.25 eV shift in work function and a 23% reduction in sheet resistance, while direct hydrogen plasma exposure caused over 50% film removal. Surface and structural analyses using X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), Raman spectroscopy, and scanning electron microscopy (SEM) revealed PSS degradation and a PEDOT structural transition from the benzoid to quinoid form, enhancing inter-chain connectivity and electrical conductivity. These effects are attributed to photodissociation between plasma photons and PEDOT:PSS films. The results highlight VUV-tailored plasma emission as a promising approach for interface engineering and charge injection optimization in next-generation OLEDs.