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      HVPE에 의해 성장된 AlGaN epi layer의 특성 = The properties of AlGaN epi layer grown by HVPE

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      https://www.riss.kr/link?id=A101122752

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      다국어 초록 (Multilingual Abstract)

      The AlGaN layer has direct wide bandgaps ranging from 3.4 to 6.2 eV. Nowadays, it is becoming more important to fabricate optical devices in an UV region for the many applications. The high quality AlGaN layer is necessary to establish the UV optical devices. However, the growth of AlGaN layer on GaN layer is difficult due to the lattice mismatch and difference thermal expansion coefficient between GaN layer and AlGaN layer. In this paper, we attempted to grow the LED structure on GaN template by mixed-source HVPE method with multi-sliding boat system. We tried to find the optical and lattice transition of active layer by control the Al content in mixed-source. For the growth of epi layer, the HCl and $NH_3$ gas were flowed over the mixed-source and the carrier gas was $N_2$. The temperature of source zone and growth zone was stabled at 900 and $1090^{\circ}C$, respectively. After the growth, we performed the x-ray diffraction (XRD) and electro luminescence (EL) measurement.
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      The AlGaN layer has direct wide bandgaps ranging from 3.4 to 6.2 eV. Nowadays, it is becoming more important to fabricate optical devices in an UV region for the many applications. The high quality AlGaN layer is necessary to establish the UV optical ...

      The AlGaN layer has direct wide bandgaps ranging from 3.4 to 6.2 eV. Nowadays, it is becoming more important to fabricate optical devices in an UV region for the many applications. The high quality AlGaN layer is necessary to establish the UV optical devices. However, the growth of AlGaN layer on GaN layer is difficult due to the lattice mismatch and difference thermal expansion coefficient between GaN layer and AlGaN layer. In this paper, we attempted to grow the LED structure on GaN template by mixed-source HVPE method with multi-sliding boat system. We tried to find the optical and lattice transition of active layer by control the Al content in mixed-source. For the growth of epi layer, the HCl and $NH_3$ gas were flowed over the mixed-source and the carrier gas was $N_2$. The temperature of source zone and growth zone was stabled at 900 and $1090^{\circ}C$, respectively. After the growth, we performed the x-ray diffraction (XRD) and electro luminescence (EL) measurement.

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      참고문헌 (Reference)

      1 H. Ashraf, "Thick GaN layers grown by HVPE: Influence of the templates" 310 : 3957-, 2008

      2 I.-S. Seo, "The role of AlN buffer layer in AlxGa1−.xN/GaN heterostructures with x from 0.35 to 0.5 grown on sapphire (0 0 0 1)" 241 : 297-, 2002

      3 Motoaki Iwaya, "Suppression of phase separation of AlGaN during lateral growth and fabrication of high-efficiency UV-LED on optimized AlGaN" 237 : 951-955, 2002

      4 S.T. Kim, "Preparation and properties of free-standing HVPE grown GaN substrates" 194 : 37-, 1998

      5 A. Krost, "Nearly strain-free AlGaN on (0 0 0 1) sapphire: X-ray measurements and a new crystallographic growth model" 221 : 251-, 2000

      6 Yamina Andre, "Low dislocation density high-quality thick hydride vapour phase epitaxy (HVPE) GaN layers" 306 : 86-, 2007

      7 A.A. Allerman, "Growth and design of deep-UV (240~290 nm) light emitting diodes using AlGaN alloys" 272 : 227-, 2004

      8 A. SH. Hussein, "Effect of Al mole fraction on structural and electrical properties of AlxGa1 −. xN/GaN heterostructures grown by plasma-assisted molecular beam epitaxy" 257 : 4159-, 2011

      9 B. L⁄. ucznik, "Deposition of thickGaN layers by HVPE on the pressure grown GaN substrates" 281 : 38-, 2005

      10 T. Namazu, "Characterization of single crystal silicon and electroplated nickel films by uniaxial tensile test with in situ X-ray diffraction measurement" 30 : 13-, 2007

      1 H. Ashraf, "Thick GaN layers grown by HVPE: Influence of the templates" 310 : 3957-, 2008

      2 I.-S. Seo, "The role of AlN buffer layer in AlxGa1−.xN/GaN heterostructures with x from 0.35 to 0.5 grown on sapphire (0 0 0 1)" 241 : 297-, 2002

      3 Motoaki Iwaya, "Suppression of phase separation of AlGaN during lateral growth and fabrication of high-efficiency UV-LED on optimized AlGaN" 237 : 951-955, 2002

      4 S.T. Kim, "Preparation and properties of free-standing HVPE grown GaN substrates" 194 : 37-, 1998

      5 A. Krost, "Nearly strain-free AlGaN on (0 0 0 1) sapphire: X-ray measurements and a new crystallographic growth model" 221 : 251-, 2000

      6 Yamina Andre, "Low dislocation density high-quality thick hydride vapour phase epitaxy (HVPE) GaN layers" 306 : 86-, 2007

      7 A.A. Allerman, "Growth and design of deep-UV (240~290 nm) light emitting diodes using AlGaN alloys" 272 : 227-, 2004

      8 A. SH. Hussein, "Effect of Al mole fraction on structural and electrical properties of AlxGa1 −. xN/GaN heterostructures grown by plasma-assisted molecular beam epitaxy" 257 : 4159-, 2011

      9 B. L⁄. ucznik, "Deposition of thickGaN layers by HVPE on the pressure grown GaN substrates" 281 : 38-, 2005

      10 T. Namazu, "Characterization of single crystal silicon and electroplated nickel films by uniaxial tensile test with in situ X-ray diffraction measurement" 30 : 13-, 2007

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      학술지 이력

      학술지 이력
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      2028 평가예정 재인증평가 신청대상 (재인증)
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      2012-03-29 학술지명변경 외국어명 : Jounal of Korea Associaiton of Crystal Gorwth -> Journal of the Korean Crystal Growth and Crystal Technology KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
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      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.24 0.24 0.23
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.2 0.17 0.244 0.09
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