1 정민수, "차량 전원 안정성 향상을 위한 Diagnosis System 채택 Intelligent Smart Junction Box 개발" 대한전기학회 57 (57): 276-285, 2008
2 연규봉, "자동차용 센서 시스템 IC 기술개발 동향및 고신뢰성 이슈" 40 (40): 18-27, 2013
3 이승규, "자동차용 반도체 시장 동향 및 기술현황" 39 (39): 64-69, 2012
4 NXP Semiconductors, "TJA1043: High Speed CAN Transceiver"
5 S. Kim, "Study on testing the Smart Junction Box using the HIL System" Honam University 2012
6 Freescale Semiconductor, "MC33972: Multiple Switch Detection Interface with Suppressed Wake-up"
7 "ISO 7637-2 Road vehicles – Electrical disturbances from conduction and coupling -part2: Electrical transient conduction along supply lines only"
8 Yano Research Institute, "Global In-Vehicle Semiconductor Market: Key Research Findings 2012.4.18"
9 Infineon, "BTS5090-2EKA: Smart High-Side Power Switch with Dual Channel"
10 "Autosplice Inc"
1 정민수, "차량 전원 안정성 향상을 위한 Diagnosis System 채택 Intelligent Smart Junction Box 개발" 대한전기학회 57 (57): 276-285, 2008
2 연규봉, "자동차용 센서 시스템 IC 기술개발 동향및 고신뢰성 이슈" 40 (40): 18-27, 2013
3 이승규, "자동차용 반도체 시장 동향 및 기술현황" 39 (39): 64-69, 2012
4 NXP Semiconductors, "TJA1043: High Speed CAN Transceiver"
5 S. Kim, "Study on testing the Smart Junction Box using the HIL System" Honam University 2012
6 Freescale Semiconductor, "MC33972: Multiple Switch Detection Interface with Suppressed Wake-up"
7 "ISO 7637-2 Road vehicles – Electrical disturbances from conduction and coupling -part2: Electrical transient conduction along supply lines only"
8 Yano Research Institute, "Global In-Vehicle Semiconductor Market: Key Research Findings 2012.4.18"
9 Infineon, "BTS5090-2EKA: Smart High-Side Power Switch with Dual Channel"
10 "Autosplice Inc"
11 "AEC-Q100 Failure Mechanism based stress test qualification for integrated circuits"