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(Keynote) History and Future Directions in SiGe HBT BiCMOS Technology and Its Applications
Harame, D.; Joseph, A.; Cheng, P.; Jain, V.; Camillo-Castillo, R. Pennington, N.J.; Electrochemical Society 2012 p.3-14
Raskin, J.-P. Pennington, N.J.; Electrochemical Society 2012 p.15-24
(Invited) Pure Dopant Deposition of B and Ga for Ultrashallow Junctions in Si-based Devices
Nanver, L.K.; Sammak, A.; Mohammadi, V.; Mok, K.R.C.; Qi, L.; Sakic, A.; Golshani, N.; Derakhshandeh, J.; Scholtes, T.M.L.; de Boer, W.B. Pennington, N.J.; Electrochemical Society 2012 p.25-34
(Invited) The Human Factor in Mixed-Signal Design and Its Consequences for Design and Automation
Brederlow, R. Pennington, N.J.; Electrochemical Society 2012 p.35-40
(Invited) Overview of Fully Depleted SOI Technology and Circuit Benefits
Mazure, C.; Nguyen, B.-Y. Pennington, N.J.; Electrochemical Society 2012 p.41-50
On the Variability of the Low-Frequency Noise in UTBOX SOI nMOSFETs
Simoen, E.; Andrade, G.M.C.; Almeida, L.M.; Aoulaiche, M.; Caillat, C.; Jurczak, M.; Claeys, C. Pennington, N.J.; Electrochemical Society 2012 p.51-58
Beneficial Effect of very Thin Active Layer on the Performance of Microcrystalline Silicon TFTs
Samb, M.L.; Jacques, E.; Kandoussi, K.; Belarbi, K.; Coulon, N.; Mohammed-Brahim, T. Pennington, N.J.; Electrochemical Society 2012 p.59-68
Analysis of Total Ionizing Dose Effects on a Pseudo-Static Random Access Memory (PSRAM)
Both, T.H.; Wirth, G.I.; Junior, E.C.F.P.; Goncalez, O.L.; Vaz, R.G.; Pereira, M.A.; Milagres, D.C. Pennington, N.J.; Electrochemical Society 2012 p.69-76
de Souza, M.A.S.; Doria, R.T.; de Souza, M.; Martino, J.A.; Pavanello, M.A. Pennington, N.J.; Electrochemical Society 2012 p.77-84
Phenomenological Modeling of Charge Injection - Beyond the Schottky Barrier Paradigm
Blawid, S.; Claus, M.; Schroter, M. Pennington, N.J.; Electrochemical Society 2012 p.85-92