A Mark Automatic Checking System to Inspect Character String on Chip

국문 초록 (Abstract)

칩의 마크는 종류별로 다르고 매우 작아서 작업자가 육안 검사로 처리하기에는 매우 어려운 작업이다. 본 논문에서는 칩의 마크를 인식하여 잘못된 마크를 판별하는 마크 자동 검사 시스템에 대하여 제안한다. 불량항목을 검사하기 위해서 템플릿 매칭 방법과 다양한 불량 판별 조건을 사용한다. 그리고 불량판별 조건은 문자 ROI 명암도, 문자 ROI 매칭, 문자 명암도, 브로컨, 브렌치로 분류된다. 제안된 방법은 마크 불량 판별에 커다란 성능향상이 보임을 일련의 실험들을 통하여 보여준다.

다국어 초록 (Multilingual Abstract)

The character strings on chips and components are so tiny and numerous that it is a very difficult work for people to perform. In this paper, we propose a mark automatic checking system, which will determine whether chip is wrong-mark or not by recognizing characters on chips. Lots of faulty detection conditions and template matching methods are used to inspect the faulty mark items. The faulty detection classifies conditions as five kinds-darkness, matching, area, broken and branch. A series of experimentation show that the method proposed here can offer an effective way to determine wrong-mark on chips.

참고문헌 (Reference)

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