Understanding radiation effects in SRAM-based fi eld programmable gate arrays for implementing instrumentation and control systems of nuclear power plants

다국어 초록 (Multilingual Abstract)

Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-criticalapplication development of nuclear power plant instrumentation and control systems. The high logicdensity and advancements in architectural features make static random access memory (SRAM)-basedFPGAs suitable for complex design implementations. Devices deployed in the nuclear environmentface radiation particle strike that causes transient and permanent failures. The major reasons for failuresare total ionization dose effects, displacement damage dose effects, and single event effects. Differentfrom the case of space applications, soft errors are the major concern in terrestrial applications. In thisarticle, a review of radiation effects on FPGAs is presented, especially soft errors in SRAM-based FPGAs.
Single event upset (SEU) shows a high probability of error in the dependable application development inFPGAs. This survey covers the main sources of radiation and its effects on FPGAs, with emphasis on SEUsas well as on the measurement of radiation upset sensitivity and irradiation experimental results atvarious facilities. This article also presents a comparison between the major SEU mitigation techniques inthe configuration memory and user logics of SRAM-based FPGAs.

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