The knowledge on the number of necessary and collectable reflections for the crystal structure analysis is greatly helpful in choosing the conditions for X-ray intensity data collection using automatic four circle diffractometer. In this paper, we rep...
The knowledge on the number of necessary and collectable reflections for the crystal structure analysis is greatly helpful in choosing the conditions for X-ray intensity data collection using automatic four circle diffractometer. In this paper, we represent a method to calculate the total unmber of collectable intensity date in an asymmetric unit.