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      KCI등재 SCI SCIE SCOPUS

      Degradation Behavior of 850 nm AlGaAs/GaAs Oxide VCSELs Suffered from Electrostatic Discharge

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      https://www.riss.kr/link?id=A103381138

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      다국어 초록 (Multilingual Abstract) kakao i 다국어 번역

      The effect of forward and reverse electrostatic discharge (ESD) on the electro-optical characteristics of oxide vertical-cavity surface-emitting lasers is investigated using a human body model for the purpose of understanding degradation behavior. Forward ESD-induced degradation is complicated, showing three degradation phases depending on ESD voltage, while reverse ESD-induced degradation is relatively simple, exhibiting two phases of degradation divided by a sudden distinctive change in electro-optical characteristics. We demonstrate that the increase in the threshold current is mainly due to the increase in leakage current, nonradiative recombination current, and optical loss. The decrease in the slope efficiency is mainly due to the increase in optical loss.
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      The effect of forward and reverse electrostatic discharge (ESD) on the electro-optical characteristics of oxide vertical-cavity surface-emitting lasers is investigated using a human body model for the purpose of understanding degradation behavior. For...

      The effect of forward and reverse electrostatic discharge (ESD) on the electro-optical characteristics of oxide vertical-cavity surface-emitting lasers is investigated using a human body model for the purpose of understanding degradation behavior. Forward ESD-induced degradation is complicated, showing three degradation phases depending on ESD voltage, while reverse ESD-induced degradation is relatively simple, exhibiting two phases of degradation divided by a sudden distinctive change in electro-optical characteristics. We demonstrate that the increase in the threshold current is mainly due to the increase in leakage current, nonradiative recombination current, and optical loss. The decrease in the slope efficiency is mainly due to the increase in optical loss.

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      참고문헌 (Reference)

      1 "“Sensitivity Testing, Human Body Model, Component Level,” ESD Association, Rome, ESD STM5.1"

      2 J. Jeong, "Wavelength Shifts of 1.5- mm DFB Lasers Due to Human-Body-Model Electronic Discharge Followed by Accelerated Aging Experiments" 13 (13): 186-190, 1995

      3 J. Krueger, "Studies of ESD-Related Failure Patterns of Agilent Oxide VCSELs" 1662-172, 2003

      4 A. Chow, "Smart Optical Sensors for Industrial and Consumer Applications" 101-106, 2006

      5 H.C. Neitzert, "Sensitivity of Proton Implanted VCSELs to Electrostatic Discharge Pulses" 7 (7): 231-241, 2001

      6 H. Mizuno, "Replicated Polymeric Optical Waveguide Devices with Large Core Connectable on Plastic Optical Fiber Using Thermo-plastic and Thermo-curable Resins" 24 (24): 919-926, 2006

      7 B. M. Hawkins, "Reliability of Various Size Oxide Aperture VCSELs" 540-550, 2002

      8 C. Helms, "Reliability of Oxide VCSELs at Emcore" 183-189, 2004

      9 M. Gruber, "Planar-Integrated Free-Space Optical Fan-Out Module for MT-Connected Fiber Ribbons" 22 (22): 2218-2222, 2004

      10 L.F. DeChiaro, "Improvement in Electrostatic Discharge Performance of InGaAsP Semiconductor Lasers by Facet Passivation" 39 (39): 561-565, 1992

      1 "“Sensitivity Testing, Human Body Model, Component Level,” ESD Association, Rome, ESD STM5.1"

      2 J. Jeong, "Wavelength Shifts of 1.5- mm DFB Lasers Due to Human-Body-Model Electronic Discharge Followed by Accelerated Aging Experiments" 13 (13): 186-190, 1995

      3 J. Krueger, "Studies of ESD-Related Failure Patterns of Agilent Oxide VCSELs" 1662-172, 2003

      4 A. Chow, "Smart Optical Sensors for Industrial and Consumer Applications" 101-106, 2006

      5 H.C. Neitzert, "Sensitivity of Proton Implanted VCSELs to Electrostatic Discharge Pulses" 7 (7): 231-241, 2001

      6 H. Mizuno, "Replicated Polymeric Optical Waveguide Devices with Large Core Connectable on Plastic Optical Fiber Using Thermo-plastic and Thermo-curable Resins" 24 (24): 919-926, 2006

      7 B. M. Hawkins, "Reliability of Various Size Oxide Aperture VCSELs" 540-550, 2002

      8 C. Helms, "Reliability of Oxide VCSELs at Emcore" 183-189, 2004

      9 M. Gruber, "Planar-Integrated Free-Space Optical Fan-Out Module for MT-Connected Fiber Ribbons" 22 (22): 2218-2222, 2004

      10 L.F. DeChiaro, "Improvement in Electrostatic Discharge Performance of InGaAsP Semiconductor Lasers by Facet Passivation" 39 (39): 561-565, 1992

      11 J.-S. Huang, "Human-Body-Model Electrostatic Discharge and Electrical-Overstress Studies of Buried-Heterostructure Semiconductor Lasers" 7 (7): 453-461, 2007

      12 P.D. Wright, "Electrical Derivative Characteristics of InGaAsP Buried Heterostructure Lasers" 61 : 1720-1724, 1987

      13 W.B. Joyce, "Electrical Characterization of Heterostructure Laser" 49 : 3719-3728, 1978

      14 A. Ramaswamy, "Electrical Characteristics of Proton- Implanted Vertical-Cavity Surface-Emitting Lasers" 34 (34): 2233-2240, 1998

      15 P.A. Barnes, "Derivative Measurements of the Current-Voltage Characteristics of Double-Heterostructure Injection Lasers" QE-12 : 633-639, 1976

      16 Å. Haglund, "Comparative Study of the High-Speed Digital Modulation Performance of Single- and Multi-mode Oxide Confined VCSELs for Free Space Optical Interconnects" 272-280, 2002

      17 S.A. McHugo, "Characterization of Failure Mechanisms for Oxide VCSELs" 55-66, 2003

      18 H. Ichikawa, "Analysis on ESD-Induced Degradation of GaInAsP LD" (64) : 9-14, 2007

      19 D. Mathes, "AOC Moving Forward: The Impact of Materials Behavior" 162-172, 2003

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      학술지 이력

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      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
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      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.78 0.28 0.57
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.47 0.42 0.4 0.06
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