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Circuit analysis of active mode parasitic oscillations in IGBT modules
Palmer, P. R.; Joyce, J. C. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.85-91
Estimation of equivalent circuit parameters for a millimetre-wave GaAs PIN diode switch
Takasu, H. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.92-94
Statistical nonlinear model of MESFET and HEMT devices
Di Martino, A.; Marietti, P.; Olivieri, M.; Tommasino, P.; Trifiletti, A. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.95-103
Transient response testing of nonlinear analogue circuits using optimised fault sets
Taylor, D.; Platts, A. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.104-112
Adaptive phase measurement system for surface profile measurement
Pugh, A. J.; Houghton, W.; Belmont, M. R.; Shepherd, P. R.; Pennock, S. R. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.113-118
Computation of AB^2 multiplication in GF(2^m) using low-complexity systolic architecture
Kim, N.-Y.; Kim, H.-S.; Yoo, K.-Y. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.119-123
Motion estimation using MSD-first processing
Su, C.-L.; Jen, C.-W. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.124-133
Frequency offset compensation in fractionally spaced equalisation
Gerosa, A.; Xotta, A.; Neviani, A.; Mian, G. A. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.134-140
Expression of transient phenomena at faults on ideal transmission lines by Laguerre functions
Yonemoto, A.; Hisakado, T.; Okumura, K. INSTITUTION OF ELECTRICAL ENGINEERS 2003 p.141-147