테라헤르츠 단층 영상을 이용한 비파괴 검사 = Nondestructive Test Using Terahertz Tomography

다국어 초록 (Multilingual Abstract)

Terahertz time-of-flight tomography was tried using a reflection-type time-domain spectroscopy. Two-dimensional multi-slice tomography was obtained for the samples having planar surfaces. A depth imaging from the time index of the peak amplitude of the terahertz wave and tomography of multi-layered phantom were successfully obtained using the time delay. Potential use of the terahertz tomography for nondestructive test is shown with integrated circuits. Short-time Fourier transform (STFT) was used as a post processing method.

참고문헌 (Reference)

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