Sensors that detect various types of gases that are harmful to the human body have a wide range of applications in industry and home. However, there is a lack of research on nitrogen dioxide (NO2), which causes major adverse effects on the human body ...
Sensors that detect various types of gases that are harmful to the human body have a wide range of applications in industry and home. However, there is a lack of research on nitrogen dioxide (NO2), which causes major adverse effects on the human body such as hypertension and myocardial infarction. While sensors using metal oxide semiconductor technology with 2-terminal have been reported, they generally suffer from limited sensitivity and vulnerability to temperature changes. In comparison, 3-terminal transistor-based gas sensors show high sensitivity and are favorable for miniaturization. In particular, amorphous IGZO (a-IGZO) thin-film transistors (TFTs) are representative high-performance, high-reliability, and high-stability n-type semiconductors, and have the advantages of high carrier mobility and low-temperature processing. In addition, its amorphous structure allows it to be uniformly deposited over a large area and it is known to be an excellent material in terms of reproducibility. Therefore, for the commercialization and performance development of gas sensors, we propose an optimal channel structure with excellent performance based on a-IGZO TFTs fabricated on an industry-standard 8-inch wafer.
The first chapter compares the advantages and limitations of different gas sensor types, and presents the advantages of a-IGZO TFT-based gas sensors. Furthermore, we briefly summarize the progress and limitations of previous studies and propose metrics for the evaluation of gas sensor measurement results in this work.
In the second chapter, we fabricate and demonstrate a-IGZO TFTs at the scale of an industry-standard 8-inch wafer, and characterize the device depending on the geometry of the channel. Moving away from device-level studies, we move up to the wafer level and study multiple channel structures with a-IGZOs as active layers. Devices with multi-channel structures maintain excellent performance and do not require additional fabrication processes and costs because they utilize existing photolithography facilities.
In the third chapter, a sensor to detect NO2 based on the fabricated device is studied. We extracted the property of the fabricated device based on the NO2 sensing mechanism using a-IGZO. Additionally, we confirmed the sensing performance in the multiple channel structure and performed NO2 gas sensing in the device after RTP.
In this study, in order to mass-produce a-IGZO TFTs, we moved from device-level research to wafer-level research. Furthermore, we tried to find an amorphous IGZO thin-film transistor with an optimal channel structure and conducted experiments to detect NO2 gas in the fabricated a-IGZO TFT. This paper suggests the possibility of mass production of a-IGZO TFTs fabricated at the wafer scale and is expected to provide guidelines for the structure of a-IGZO channels to improve the performance of NO2 gas detection sensors.