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      3.3kV SiC MOSFET 설계 및 제작을 위한 JFET 및 FLR 최적화 연구 = A study on JFET and FLR Optimization for the design and fabrication of 3.3kV SiC MOSFET

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      https://www.riss.kr/link?id=A108762021

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      The potential performance benefits of Silicon Carbide(SiC) MOSFETs in high power, high frequency power switching applications have been well established over the past 20 years. In the past few years, SiC MOSFET offerings have been announced by suppliers as die, discrete, module and system level products. In high-voltage SiC vertical devices, major design concerns is the edge termination and cell pitch design Field Limiting Rings(FLR) based structures are commonly used in the edge termination approaches. This study presents a comprehensive analysis of the impact of variation of FLR and JFET region on the performance of a 3.3 kV SiC MOSFET during. The improvement in MOSFET reverse bias by optimizing the field ring design and its influence on the nominal operating performance is evaluated. And, manufacturability of the optimization of the JFET region of the SiC MOSFET was also examined by investigating full-map electrical characteristics.
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      The potential performance benefits of Silicon Carbide(SiC) MOSFETs in high power, high frequency power switching applications have been well established over the past 20 years. In the past few years, SiC MOSFET offerings have been announced by supplie...

      The potential performance benefits of Silicon Carbide(SiC) MOSFETs in high power, high frequency power switching applications have been well established over the past 20 years. In the past few years, SiC MOSFET offerings have been announced by suppliers as die, discrete, module and system level products. In high-voltage SiC vertical devices, major design concerns is the edge termination and cell pitch design Field Limiting Rings(FLR) based structures are commonly used in the edge termination approaches. This study presents a comprehensive analysis of the impact of variation of FLR and JFET region on the performance of a 3.3 kV SiC MOSFET during. The improvement in MOSFET reverse bias by optimizing the field ring design and its influence on the nominal operating performance is evaluated. And, manufacturability of the optimization of the JFET region of the SiC MOSFET was also examined by investigating full-map electrical characteristics.

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      참고문헌 (Reference)

      1 Kimoto T., 54 : 040103-1-040103-27, 2015

      2 Koutarou Kawahara, 108 : 033706-, 2010

      3 김동진 ; 방정환 ; 김민수, "전기자동차 파워 인버터용 전력반도체 소자의 발전: SiC 및 GaN" 한국마이크로전자및패키징학회 30 (30): 43-51, 2023

      4 이진선 ; 강태영 ; 김경환, "대향 타겟 스퍼터링법으로 제작한 SiC SBD의 전기적 특성" 한국반도체디스플레이기술학회 14 (14): 27-30, 2015

      5 R. Perez, "A highly effective edge termination design for SiC planar high power devices" 457–460 : 1253-1256, 2004

      6 S. H. Ryu, "10 kV, 5A 4H-SiC power DMOSFET" 265-268, 2006

      1 Kimoto T., 54 : 040103-1-040103-27, 2015

      2 Koutarou Kawahara, 108 : 033706-, 2010

      3 김동진 ; 방정환 ; 김민수, "전기자동차 파워 인버터용 전력반도체 소자의 발전: SiC 및 GaN" 한국마이크로전자및패키징학회 30 (30): 43-51, 2023

      4 이진선 ; 강태영 ; 김경환, "대향 타겟 스퍼터링법으로 제작한 SiC SBD의 전기적 특성" 한국반도체디스플레이기술학회 14 (14): 27-30, 2015

      5 R. Perez, "A highly effective edge termination design for SiC planar high power devices" 457–460 : 1253-1256, 2004

      6 S. H. Ryu, "10 kV, 5A 4H-SiC power DMOSFET" 265-268, 2006

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