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이 학술지의 논문 검색
Doughty, C.;Zhai, Q.;Lantigua, M. Electrochemical Society 2000 p.1-12
The Integration of PECVD BPSG Films as a Pre-Metal Dielectric
Albrecht, G.;King, W. Electrochemical Society 2000 p.13-33
Sundaram, K. B.;Sah, R. E.;Balachandran, K. Electrochemical Society 2000 p.34-41
Characterization of n+ uc-Si:H for TFTs Fabricated at 120 C on Plastic Substrates
Charania, T.;Park, B.;Sazanov, A.;Striakhilev, D.;Nathan, A. Electrochemical Society 2000 p.42-47
Gas Phase Analysis of TiC and TiN Plasma Enhanced CVD Processes by Molecular Beam Mass Spectrometry
Amato-Wierda, C. C.;Reddy, C. M. Electrochemical Society 2000 p.48-57
All Dry CVD-Based Resist for Advanced Lithography Processes
Monget, C.;Joubert, O.;Vallier, L.;Weidman, T. W. Electrochemical Society 2000 p.58-71
Modeling of Ionized Physical Vapor Deposition of Copper
Bloomfield, M. O.;Richards, D. F.;Cale, T. S. Electrochemical Society 2000 p.72-79
Bain, M. F.;Armstrong, B. M.;Gamble, H. S. Electrochemical Society 2000 p.80-89
Pichon, L.;Camelio, S.;Drouet, M.;Girardeau, T.;Lignou, F.;Straboni, A. Electrochemical Society 2000 p.90-99
Goodlin, B. E.;Boning, D. S.;Sawin, H. H.;Yang, M. Electrochemical Society 2000 p.100-123