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High-k dielectrics by UV photo-assisted chemical vapour deposition
Fang, Q., Zhang, J.Y.,Wang, Z.M.,He, G.,Yu, J.,Boyd, Ian W. The Korean Institute of Electrical and Electronic Material Engineers 2003 p.61.3-61.4
Dielectric property and conduction mechanism of ultrathin zirconium oxide films
Chang, J.P., Lin, Y.S. The Korean Institute of Electrical and Electronic Material Engineers 2003 p.61.1-61.1
Annealing Effects on Ultra thin MOS Capacitors
Ng, Alvin Chi-hai, Xu, Jun,Xu, J.B.,Cheung, W.Y. The Korean Institute of Electrical and Electronic Material Engineers 2003 p.62.1-62.1
Fischetti, Massimo V., Caritier, Eduard A. The Korean Institute of Electrical and Electronic Material Engineers 2003 p.62.3-62.4
Noda, Minoru, Kodama, Kazushi,Kitai, Satoshi,Takahashi, Mitsue,Kanashima, Takeshi,Okuyama, Masanori The Korean Institute of Electrical and Electronic Material Engineers 2003 p.64.1-64.1