Comprehensive understanding of degradation mechanism of high efficiency blue organic light-emitting diodes at the interface by hole and electron transport layer

다국어 초록 (Multilingual Abstract)

<P><B>Abstract</B></P> <P>Comprehensive study to understand the degradation mechanism of high efficiency blue organic light-emitting diodes by charge transport layers was carried out by managing the device parameters and charge transport materials. Although it has been generally accepted that the charge transport layers are important for long lifetime, the degradation mechanism was not clear. From this work, it was revealed that exciton quenching of emitters by the degradation products of charge transport layers is the main degradation pathway of blue phosphorescent and thermally activated delayed fluorescent organic light-emitting diodes. It was described that the degradation of the blue devices by the charge transport layers would be largely avoided by separating the exciton generating emitters from the charge transport layers by shifting the exciton formation zone to the center of the emitting layer. Eventually, the lifetime of the blue devices with the emission zone fall apart from the charge transport layers was not affected by the charge transport layers because exciton quenching by the degradation products of the charge transport layers was suppressed.</P> <P><B>Highlights</B></P> <P> <UL> <LI> Exciton quenching by degradation of hole and electron transport materials. </LI> <LI> Relationship between recombination zone and degradation by charge transport materials. </LI> <LI> Management of recombination zone to suppress degradation by charge transport materials. </LI> </UL> </P> <P><B>Graphical abstract</B></P> <P>[DISPLAY OMISSION]</P>