The variation of parameters in the chips due to the microscopic semiconductor fabrication process, have been a critical problem on the industry as the chip size is scaling down. Particularly, the variation on Delay Time() and Leakage Current() propert...
The variation of parameters in the chips due to the microscopic semiconductor fabrication process, have been a critical problem on the industry as the chip size is scaling down. Particularly, the variation on Delay Time() and Leakage Current() properties are arising as the main factor of yield reduction. It is available to control and by tunning the threshold voltage(). However, the characteristic between and shows trade-off relationship in terms of improvement of the performances. Therefore, it is required to apply different on each chip respectively, in order to control variations of the two characteristics. This process is called ABB(Adaptive Body Bias), which applies the voltage on the substrate to control the .
In this paper, the novel sub-threshold leakage current sensing circuit with Integrating Analog-to-Digital(ADC) Converter based on ABB. It was designed in terms of two important points. First, the switch which floating the target MOSFET was designed Staked MOSFET, to avoid the by-pass current. Second, Integrating ADC was inserted at the sensing circuit to get more stable converting performance.
In order to prove the effect of this circuit, the simulation was implemented and the real chip was fabricated. in the result of simulation, we could sense the variation of accurately. The simulation output result showed same tendency with real leakage current, and ADC output, measuring value of the chip showed 2% of error rate.