Microstructural evolution of Ti/Al layered structures annealed at various temperature has been investigated by using optical microscopy, scanning electron microscopy, and X-ray diffractometry. Ti/Al layered sheets have been produced by dipping two Ti ...
Microstructural evolution of Ti/Al layered structures annealed at various temperature has been investigated by using optical microscopy, scanning electron microscopy, and X-ray diffractometry. Ti/Al layered sheets have been produced by dipping two Ti sheets in Al melt. The Ti/Al interfaces showed good bonding characteristics in as-dipped sheet. Microstructure of the heat-treated Ti/Al sheet varies depending on the subsequent annealing temperature. In the Ti/Al layered composite annealed at temperature below Al melting point, thin TiAl₃ layer was formed by the diffusion process at the Ti/Al interfaces. In the case of composite exposed at temperature above Al melting point, the equiaxed TiAl₃particles protruded into Al matrix from the thin TiAl₃ layer as well as the formation of thin TiAl₃ layer. TiAl₃ particles become homogeneously distributed within the Al matrix away from the Ti/Al interface with increasing annealing time. The formation of TiAl₃ phase in Ti/Al sheet annealed at temperature above Al melting point is believed to be formed by the exothermic chemical reaction.