We report on the annealing effect and ferromagnetic characteristics of Zn_(0.7)Mn_(0.3)O film prepared by sol-gel method on the silicon (100) substrate using field emission-scanning electron microscopy (FE-SEM), energy dispersive spectroscopy (EDS), X...
We report on the annealing effect and ferromagnetic characteristics of Zn_(0.7)Mn_(0.3)O film prepared by sol-gel method on the silicon (100) substrate using field emission-scanning electron microscopy (FE-SEM), energy dispersive spectroscopy (EDS), X-ray diffractometry (XRD) and superconducting quantum interference device (SQUID) magnetometry. Magnetic measurements show that Zn_(0.7)Mn_(0.3)O films exhibit ferromagnetism at 5 K revealing the coercive field of ~110 Oe for as grown sample and 360, 1035 Oe for samples annealed at 700, 800 ℃, respectively. Our experimental evidence suggests that ferromagnetic precipitates of a manganese oxide may be responsible for the observed ferromagnetic behaviors of the film.