RISS 학술연구정보서비스

검색
다국어 입력

http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.

변환된 중국어를 복사하여 사용하시면 됩니다.

예시)
  • 中文 을 입력하시려면 zhongwen을 입력하시고 space를누르시면됩니다.
  • 北京 을 입력하시려면 beijing을 입력하시고 space를 누르시면 됩니다.
닫기
    인기검색어 순위 펼치기

    RISS 인기검색어

      KCI등재

      HVPE 법을 활용한 GaN 성장 시 질화처리에 관한 연구 = A study on the nitridation of GaN crystal growth by HVPE method

      한글로보기

      https://www.riss.kr/link?id=A106355782

      • 0

        상세조회
      • 0

        다운로드
      서지정보 열기
      • 내보내기
      • 내책장담기
      • 공유하기
      • 오류접수

      부가정보

      다국어 초록 (Multilingual Abstract)

      HVPE is one of the GaN single crystal manufacturing methods which has been commercially widely used due to its high growth rate. HVPE method consists of a number of processes, in particular the nitridation of the substrate prior to GaN growth has a significant effect on the crystalline quality of the manufactured GaN single crystal. In this study, we investigated the effect of nitridation for crystalline quality of GaN when it was grown on the sapphire substrate. The whole growth conditions except for the nitridation process were the same, and the gas flow rate supplied to the sapphire substrate was variously changed during the nitridation. Here, we examined the effect of nitridation via the surface characterization of GaN single crystal grown by HVPE.
      번역하기

      HVPE is one of the GaN single crystal manufacturing methods which has been commercially widely used due to its high growth rate. HVPE method consists of a number of processes, in particular the nitridation of the substrate prior to GaN growth has a si...

      HVPE is one of the GaN single crystal manufacturing methods which has been commercially widely used due to its high growth rate. HVPE method consists of a number of processes, in particular the nitridation of the substrate prior to GaN growth has a significant effect on the crystalline quality of the manufactured GaN single crystal. In this study, we investigated the effect of nitridation for crystalline quality of GaN when it was grown on the sapphire substrate. The whole growth conditions except for the nitridation process were the same, and the gas flow rate supplied to the sapphire substrate was variously changed during the nitridation. Here, we examined the effect of nitridation via the surface characterization of GaN single crystal grown by HVPE.

      더보기

      참고문헌 (Reference)

      1 이희애, "전력반도체용 GaN 기판 산업동향" 한국결정성장학회 28 (28): 159-165, 2018

      2 M. S. Lee, "Thick GaN growth via GaN nanodot formation by HVPE" 19 : 930-, 2017

      3 X. Liu, "Stress-induced in situ epitaxial lateral overgrowth of high-quality GaN" 16 : 8058-, 2014

      4 G. Namkoong, "Role of sapphire nitridation temperature on GaN growth by plasma assisted molecular beam epitaxy: Part I. Impact of the nitridation chemistry on material characteristics" 91 : 2499-, 2002

      5 E. Richter, "Reactor and growth process optimization for growth of thick GaN layers on sapphire substrates by HVPE" 277 : 6-, 2005

      6 K. Uchida, "Nitridation process of sapphire substrate surface and its effect on the growth of GaN" 79 : 3487-, 1996

      7 박재화, "HVPE 법에서의 공정변수 조절에 의한 bulk GaN 단결정의 두께 최적화" 한국결정성장학회 27 (27): 89-93, 2017

      8 K. Hiramatsu, "Growth mechanism of GaN grown on sapphire with AlN buffer layer by MOVPE" 115 : 628-, 1991

      9 H.M. Foronda, "Curvature and bow of bulk GaN substrates" 120 : 035104-, 2016

      10 K. Fujito, "Bulk GaN crystals grown by HVPE" 311 : 3011-, 2009

      1 이희애, "전력반도체용 GaN 기판 산업동향" 한국결정성장학회 28 (28): 159-165, 2018

      2 M. S. Lee, "Thick GaN growth via GaN nanodot formation by HVPE" 19 : 930-, 2017

      3 X. Liu, "Stress-induced in situ epitaxial lateral overgrowth of high-quality GaN" 16 : 8058-, 2014

      4 G. Namkoong, "Role of sapphire nitridation temperature on GaN growth by plasma assisted molecular beam epitaxy: Part I. Impact of the nitridation chemistry on material characteristics" 91 : 2499-, 2002

      5 E. Richter, "Reactor and growth process optimization for growth of thick GaN layers on sapphire substrates by HVPE" 277 : 6-, 2005

      6 K. Uchida, "Nitridation process of sapphire substrate surface and its effect on the growth of GaN" 79 : 3487-, 1996

      7 박재화, "HVPE 법에서의 공정변수 조절에 의한 bulk GaN 단결정의 두께 최적화" 한국결정성장학회 27 (27): 89-93, 2017

      8 K. Hiramatsu, "Growth mechanism of GaN grown on sapphire with AlN buffer layer by MOVPE" 115 : 628-, 1991

      9 H.M. Foronda, "Curvature and bow of bulk GaN substrates" 120 : 035104-, 2016

      10 K. Fujito, "Bulk GaN crystals grown by HVPE" 311 : 3011-, 2009

      11 D. Ehrentraut, "Advances in bulk crystal growth of AIN and GaN" 34 : 259-, 2009

      더보기

      동일학술지(권/호) 다른 논문

      동일학술지 더보기

      더보기

      분석정보

      View

      상세정보조회

      0

      Usage

      원문다운로드

      0

      대출신청

      0

      복사신청

      0

      EDDS신청

      0

      동일 주제 내 활용도 TOP

      더보기

      주제

      연도별 연구동향

      연도별 활용동향

      연관논문

      연구자 네트워크맵

      공동연구자 (7)

      유사연구자 (20) 활용도상위20명

      인용정보 인용지수 설명보기

      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2028 평가예정 재인증평가 신청대상 (재인증)
      2022-01-01 평가 등재학술지 유지 (재인증) KCI등재
      2019-01-01 평가 등재학술지 유지 (계속평가) KCI등재
      2016-01-01 평가 등재학술지 선정 (계속평가) KCI등재
      2015-12-01 평가 등재후보로 하락 (기타) KCI등재후보
      2012-03-29 학술지명변경 외국어명 : Jounal of Korea Associaiton of Crystal Gorwth -> Journal of the Korean Crystal Growth and Crystal Technology KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      1999-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
      더보기

      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.24 0.24 0.23
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.2 0.17 0.244 0.09
      더보기

      이 자료와 함께 이용한 RISS 자료

      나만을 위한 추천자료

      해외이동버튼