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KISSWe could evaluate the performance of attribute control charts by normal approximation. The pn control chart, one of them, depends on sample sizes and defective fraction for its performance, and has an disadvantage that needs much samples to use the no...
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RISS 인기검색어
최적관리한계를 이용한 VSI pn 관리도의 수행도 평가 = Performance of VSI pn Control Chart Using Optimal Limits for Attribute Control Charts
한글로보기https://www.riss.kr/link?id=A19693817
- 저자
- 발행기관
- 학술지명
- 권호사항
-
발행연도
2002
-
작성언어
-
- 주제어
-
KDC
500
-
등재정보
KCI등재
-
자료형태
학술저널
- 발행기관 URL
-
수록면
15-24(10쪽)
- 제공처
-
0
상세조회 -
0
다운로드
부가정보
다국어 초록 (Multilingual Abstract)
We could evaluate the performance of attribute control charts by normal approximation. The pn control chart, one of them, depends on sample sizes and defective fraction for its performance, and has an disadvantage that needs much samples to use the normal approximation. The usual pn control charts can not detect early shifts in process because it is taking the sampling intervals of fixed length over all times. We use, in this paper, VSI(variable sampling intervals) techniques to overcome this shortcoming. To analyze performance of pn control charts for FSI(fixed sampling intervals) and VSI(variable sampling interval), we compare ATS(average time to signals) of two charts, and evaluate the performance of each control chart by the sample sizes, process fraction defective and control limits that Ryan and Schwertman had proposed.
We could evaluate the performance of attribute control charts by normal approximation. The pn control chart, one of them, depends on sample sizes and defective fraction for its performance, and has an disadvantage that needs much samples to use the normal approximation. The usual pn control charts can not detect early shifts in process because it is taking the sampling intervals of fixed length over all times. We use, in this paper, VSI(variable sampling intervals) techniques to overcome this shortcoming. To analyze performance of pn control charts for FSI(fixed sampling intervals) and VSI(variable sampling interval), we compare ATS(average time to signals) of two charts, and evaluate the performance of each control chart by the sample sizes, process fraction defective and control limits that Ryan and Schwertman had proposed.
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