This paper reports a method treasuring magnetostriction, Young's moduli of a substrate and film and ΔE-effect with one apparatus. A substrate deposited with a thin magnetic film is parallely cantilevered paralled to a metal plate electrode, forming a...
This paper reports a method treasuring magnetostriction, Young's moduli of a substrate and film and ΔE-effect with one apparatus. A substrate deposited with a thin magnetic film is parallely cantilevered paralled to a metal plate electrode, forming a capacitive cell. The cantilever deflects due to own weight, applied electric and magnetic filed. The small change of the capacitance caused by this deflection is measured by a sensitive capacitance bridge. Young's modulus, magnetostriction and ΔE effect can be calculated by theoretical analysis with the weight, applied field and deflection data.