1 Kiyono,S.,, "Profile Measurement Using Software Datums" 61 (61): 1059-1063, 1995.
2 Gao,W.,Yokoyama,J.,Kojima,H, "Precision measurement of cylinder straightness using a scanning multi-probe system" 26 : 279-288, 2002.
3 Kounosu,K, "Measurement of Surface Profile Using Smoothed Serial Three Point Method" 61 (61): 641-645, 1995.
4 Osada,H, "Measurement of Straight Motion Accuracy" 51 (51): 161-167, 1985.
5 Li,C. J.,Li,S, "High-resolution error seperation technique for in-situ straightness measurement of machine tools and workpieces" 6 (6): 337-347, 1996.
6 Gao,W, "High accuracy profile measurement of a machined surface by the combined method" 19 (19): 55-64, 1996.
7 Park,C. H.,Chung,J. H.,Kim,S. T, "Development of a submicron order straightness measuring device" 17 (17): 124-130, 2000.
8 Fung,E. H. K, "An approach to on-machine motion error measurement of a linear slide" 29 : 51-62, 2001.
1 Kiyono,S.,, "Profile Measurement Using Software Datums" 61 (61): 1059-1063, 1995.
2 Gao,W.,Yokoyama,J.,Kojima,H, "Precision measurement of cylinder straightness using a scanning multi-probe system" 26 : 279-288, 2002.
3 Kounosu,K, "Measurement of Surface Profile Using Smoothed Serial Three Point Method" 61 (61): 641-645, 1995.
4 Osada,H, "Measurement of Straight Motion Accuracy" 51 (51): 161-167, 1985.
5 Li,C. J.,Li,S, "High-resolution error seperation technique for in-situ straightness measurement of machine tools and workpieces" 6 (6): 337-347, 1996.
6 Gao,W, "High accuracy profile measurement of a machined surface by the combined method" 19 (19): 55-64, 1996.
7 Park,C. H.,Chung,J. H.,Kim,S. T, "Development of a submicron order straightness measuring device" 17 (17): 124-130, 2000.
8 Fung,E. H. K, "An approach to on-machine motion error measurement of a linear slide" 29 : 51-62, 2001.