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      SCOPUS KCI등재

      공간주파수대역에서 기저대역 확장을 통한 원전 대비시험편과 대비 보정 시험편의 초음파 영상 개선 = Ultrasonic Images Enhancement of the SS Reference Specimen and the Reference Calibration Block for NPPs by the Combining Bases of Support for Spatial Frequency

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      https://www.riss.kr/link?id=A105149461

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      다국어 초록 (Multilingual Abstract)

      Ultrasonic microscope has been used to detect the defects on surface or inner solid. Conventionally, it has used at a single operating frequency. The resolution and quality of the measured images are determined by a characteristic of the transducer of the ultrasonic microscope. The conventional ultrasonic microscope has been used envelope detector to detect the amplitude of reflected signal, but the changes in amplitude is not sensitive enough for specimen with microstructure that in phase. In this paper, we have studied multi-frequency depth resolution enhancement with ultrasonic reflection microscope for the reflectors of a stainless steel reference specimen and a reference calibration block to be used as the material in nuclear power plants for ISI, PSI. Increased depth resolution can be obtained by taking two, three-dimensional images at more that one frequency and numerically combining the results. As results of the experiment, we could get enhanced images with the rate of contrast in proportion and high quality signal distribution for the image to the changing rate of depth for the reflectors of the two kinds of specimens.
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      Ultrasonic microscope has been used to detect the defects on surface or inner solid. Conventionally, it has used at a single operating frequency. The resolution and quality of the measured images are determined by a characteristic of the transducer of...

      Ultrasonic microscope has been used to detect the defects on surface or inner solid. Conventionally, it has used at a single operating frequency. The resolution and quality of the measured images are determined by a characteristic of the transducer of the ultrasonic microscope. The conventional ultrasonic microscope has been used envelope detector to detect the amplitude of reflected signal, but the changes in amplitude is not sensitive enough for specimen with microstructure that in phase. In this paper, we have studied multi-frequency depth resolution enhancement with ultrasonic reflection microscope for the reflectors of a stainless steel reference specimen and a reference calibration block to be used as the material in nuclear power plants for ISI, PSI. Increased depth resolution can be obtained by taking two, three-dimensional images at more that one frequency and numerically combining the results. As results of the experiment, we could get enhanced images with the rate of contrast in proportion and high quality signal distribution for the image to the changing rate of depth for the reflectors of the two kinds of specimens.

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      공동연구자 (7)

      유사연구자 (20) 활용도상위20명

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2014-03-01 평가 SCOPUS 등재 (기타) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      1999-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.15 0.15 0.14
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.14 0.13 0.255 0.03
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